1) F-N tunneling current
F-N隧穿电流
2) Fowler-Nordheim(F-N) tunneling
FOWLER-NORDHEIM(F-N)隧穿
3) enhanced F-N tunneling
增强F-N隧穿
1.
A novel flash memory cell with stacked structure (Si substrate/SiGe quantum dots/tunneling oxide/poly-Si floating gate) is proposed and demonstrated to achieve enhanced F-N tunneling for both programming and erasing.
提出了一种用于半导体闪速存储器单元的新的Si/Si Ge量子点/隧穿氧化层/多晶硅栅多层结构,该结构可以实现增强F-N隧穿的编程和擦除机制。
4) F-N tunnel effect
F-N隧穿模型
5) tunneling current
隧穿电流
1.
The external condition could induce the change of piezoelectric field in superlattices and further induce the change of tunneling current.
外界条件可引起超晶格中内建电场的变化,进而引起隧穿电流的变化。
2.
Results show that with the increment of doping level, the peak tunneling current density increases for GaInP/GaAs tandem solar cells, and the performance of GaInP tunnel junctions are much better than GaAs tunnel junctions.
主要应用高掺杂的p n结理论进行隧道结的计算研究工作 ,针对GaInP/GaAs双结电池的结构 ,选择不同的宽禁带材料研究隧道结I V特性以及不同的掺杂浓度对于其I V特性的影响 ,寻找出掺杂浓度与隧穿电流的关系曲线。
3.
The gate direct tunneling current in ultra-thin oxide is computed with different device parameters.
采用自洽解方法求解一维薛定谔方程和二维泊松方程,得到电子的量子化能级和相应的浓度分布,利用MWKB方法计算电子隧穿几率,从而得到不同栅偏置下超薄栅介质MOSFET的直接隧穿电流模型。
6) gate tunneling current
栅隧穿电流
补充资料：下隧
1.同"下遗"。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条