1) Rutherford scattering formula
卢瑟福散射公式
1.
Geometrical deduction on the Rutherford scattering formula
卢瑟福散射公式的几何证明方法
2.
While α particle scattering could only be simply introduced in general physics course and could not be fully understood, because the Rutherford scattering formula could not be derived without the knowledge of theoretical mechanics.
但因卢瑟福散射公式需利用理论力学的知识方能推导,导致该部分内容在普通物理教学中只能简单介绍而无法深入展开。
2) Rutherford elastic scattering formula
卢瑟福弹性散射公式
1.
The conventional Rutherford elastic scattering formula was based on non-relativistic wave equation of Schrdinger, so it must be corrected to predict the high-energy electron beam lithography.
传统的卢瑟福弹性散射公式是由非相对论的薛定谔波动方程得出的,在预言高能电子束曝光时,需要对其进行相对论修正。
3) rutherford scattering
卢瑟福散射
1.
This work discusses and compares the methods of deriving the Rutherford scattering formula,and analyses the Rutherford scattering in the low energy(e,2e) reactions through the study on electron impact ionization of helium.
讨论和比较了用不同理论方法导出卢瑟福散射公式;分析了低能电子入射单电离氦原子(e,2e)反应中的卢瑟福散射;尤其是通过卢瑟福公式给出了有效核电荷的表达式。
2.
Under the circumstances of shielding effect of extranuclear electron, the condition of the classics descriptions of Rutherford scattering formula is derived from the principle of uncertainty relation in the quantum mechanics.
用量子力学中不确定关系的原理,推出了在核外电子非屏蔽效应的情况下卢瑟福散射公式的经典描述的条件。
4) Rutherford formula
卢瑟福公式
1.
The Rutherford formula cannot explain α-particle s small angle scattering question.
利用量子散射理论———玻恩近似研究α粒子的散射问题,及散射原子核外电子的屏蔽效应和原子核的有限质量对散射截面的影响,对卢瑟福公式不能说明α粒子小角度散射,进行了修正,得到的结果和实验相符合。
5) Rutherford backscattering spectroscopy
卢瑟福背散射
1.
The mixing effect of three different film/substrate systems, Ti/Al, Al/Ti and Ni/Ti, which were irradiated by intense pulsed ion beam, was studied with Rutherford backscattering spectroscopy (RBS).
采用卢瑟福背散射(Rutherford backscattering spectroscopy,RBS)方法对强脉冲离子束辐照Ti/Al、Al/Ti 和Ni/Ti三组薄膜/衬底体系所形成的混合层进行了研究。
6) RBS
卢瑟福背散射
1.
Analysis of the distribution of Rb in Ion-exchanged KTP Waveguide by RBS
卢瑟福背散射分析离子交换KTP波导的Rb元素分布
2.
Rutherford backscattering (RBS) spectrum was used to measure the Ti concentration depth profile in H13 steel after Ti ion implantation.
利用卢瑟福背散射谱测量了离子注入表面的成分 ,并采用逐层递推法得出了钛在H13钢中的浓度深度分布 ,借助掠面x射线衍射考察了注入表面的相结
3.
By synchrotron X-ray diffraction (XRD) and Rutherford back scattering(RBS),the microstructure evolution of oxidized Ni/Au contact to p-GaN annealed at different temperature in air are investigated.
用卢瑟福背散射(RBS)和同步辐射X射线衍射(XRD)研究了p-GaN上的Ni/Au电极在空气下不同温度合金后的微结构的演化,并揭示这种接触结构的欧姆接触形成机制。
补充资料:卢瑟福背散射分析
分子式:
CAS号:
性质:基于带电粒子弹性散射的分析方法。这种弹性散射作用产生的出射粒子方向与入射方向的夹角接近180°,最初由卢瑟福作了理论分析和实验测量,故亦称卢瑟福背散射。可用于化合物成分分析,薄膜厚度测量,深度分布测量以及材料阻止本领测量等。
CAS号:
性质:基于带电粒子弹性散射的分析方法。这种弹性散射作用产生的出射粒子方向与入射方向的夹角接近180°,最初由卢瑟福作了理论分析和实验测量,故亦称卢瑟福背散射。可用于化合物成分分析,薄膜厚度测量,深度分布测量以及材料阻止本领测量等。
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