1) minority-carrier exclusion effect
少数载流子排斥效应
1.
Experimental results support that the minority-carrier exclusion effect can be strong in the conventional resistor structure when the silicon film is sufficiently thin,thus significantly raising the maximum operating temperature.
实验结果分析说明 ,当硅膜足够薄时 ,普通电阻结构中可表现出较强的少数载流子排斥效应 ,大大提高了本征转折温度 ,从而提高器件的最高工作温度 。
2) Repelling Effect
排斥效应
1.
Repelling Effect of Vertical Integration under Upstream Monopoly——The Case of CHINALCO
上游垄断条件下纵向一体化的排斥效应——中国铝业公司案例分析
3) effective lifetime of minority carrier
少数载流子有效寿命
1.
The main surface passivation methods for silicon solar cells at present were compared according to effective lifetime of minority carrier in Si wafers, reflection losses and spectral response of silicon solar cells.
通过对硅片的少数载流子有效寿命、硅太阳电池的反射损失和光谱响应这三个方面的研究,比较了目前主要的硅太阳电池表面钝化技术,对这些钝化技术的优缺点进行了分析和评价。
4) minority carrier
少数载流子
1.
A modified photo-induced open-circuit voltage decay method has been developed to measure the photo-generated minority carrier lifetime in HgCdTe photovoltaic detectors.
采用改进的光致开路电压衰退方法测量了不同组分Hg1-xCdxTe光伏探测器中光生少数载流子寿命。
2.
On the basis of analysis on the diffusion of minority carrier and the equivalent circuit of the LAPS, the effects of various parameters on LAPS are deduced, and a basis for fabrication of high performance LAPS is set.
详细阐述了LAPS的基本构造 ,并通过分析LAPS的电路模型及少数载流子的影响得出了各种参数对LAPS的影响 ,从而为制造高性能的LAPS提供了理论基础。
3.
The fundamental principle and calculation method to measure the minority carrier diffusion length,lifetime and bulk Fe content by surface photovoltage method were introduced.
介绍了用表面光电压(SPV)法测试少数载流子的扩散长度、少子寿命和体Fe含量的基本原理及其计算方法,分析了三种常见外延结构中少子扩散长度的测试方法及其影响因素,得出了用于表面光电压测试的外延片及衬底片应满足的条件。
6) carrier effects
载流子效应
1.
The influence of the carrier effects on the temperature rise and melt threshold, the distributions of temperature and carrier concentration in the targets are also discussed.
采用数值方法 ,研究了半导体 In Sb材料受连续波激光辐照的熔融阈值 ,讨论了 In Sb材料的熔融阈值与入射激光波长、功率密度以及辐照时间的关系 ,同时考虑了载流子效应对靶内温升过程以及熔融阈值的影响 ,给出了材料内温度与载流子密度的瞬态分
补充资料:少数载流子
分子式:
CAS号:
性质:在掺杂半导体,即非本征半导体中,对电导贡献很小的载汉子,简称少子,如n型半导体的空穴,p型半导体的电子。
CAS号:
性质:在掺杂半导体,即非本征半导体中,对电导贡献很小的载汉子,简称少子,如n型半导体的空穴,p型半导体的电子。
说明:补充资料仅用于学习参考,请勿用于其它任何用途。
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