1) Scanning Kelvin Probe Microscopy
扫描开尔文力显微术
1.
In this thesis we focused on using Scanning Kelvin Probe Microscopy mode (SKM) to characterize multi.
论文首先阐述了扫描开尔文力显微术的工作原理以及应用领域。
2) scanning force microscopy
扫描力显微术
1.
Glass-to-rubber transition of polymer film analyzed by scanning force microscopy;
扫描力显微术在高聚物薄膜玻璃化转变研究中的应用
2.
Nanoscale domain structures and polarization reversal behaviour in (111) oriented PZT60/40 thin film were investigated in situ with scanning force microscopy piezoresponse mode.
利用扫描力显微术中压电响应模式原位研究了 (111)择优取向的PZT6 0 4 0铁电薄膜的纳米尺度畴结构及其极化反转行为 。
3) scanning microscopy
扫描显微术
4) SKFM
开尔文力显微镜
1.
Samples prepared by electroless cobalt plating were firstly investigated using scanning Kelvin force microscopy (SKFM), and much local information, such as surface morphology and the surface electrical potential difference induced by inhomogeneous composition distribution has been obtained.
首次在化学镀样品上成功地实现了扫描开尔文力显微镜的测量,得到了化学镀层表面形貌以及与微观组分分布相关的表面电势差信息。
5) scanning force microscopy (SF
扫描力探针显微术
6) Scanning tunneling microscopy
扫描隧道显微术
1.
Differential spectroscopy and its application of scanning tunneling microscopy;
扫描隧道显微术中的微分谱学及其应用
2.
The progress in scanning tunneling microscopy(STM) studies of two\|dimensional magnetic structures is discussed briefly.
文章介绍了近年来利用扫描隧道显微术 (STM)对表面和薄膜磁结构的研究进展 。
补充资料：扫描电子显微镜(见扫描电子显微术)
扫描电子显微镜(见扫描电子显微术)
scanning eleetron mieroseoPe
扫描电子显微镜scanning eleetron mieroseope见扫描电子显微术。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条