1) scanning force microscopy(SFM)
扫描力显微学(SFM)
2) scanning force microscopy (SFM)
扫描力显微镜(SFM)
3) scanning force microscope
扫描力显微镜
4) scanning force microscopy
扫描力显微镜
1.
Study on nano-meter scale observation of latent tracks induced by ions are discussed using scanning tunneling microscopy(STM) and scanning force microscopy(SFM).
综述了近年来用扫描隧道显微镜 (STM )和扫描力显微镜 (SFM)在原子水平上观测辐射损伤潜径迹的研究及进展。
2.
In this thesis, Scanning Force Microscopy (SFM) was used to study the nanoscale electric phenomena of the surface and interface properties of ferroelectric thin films.
本论文利用扫描力显微镜研究了铁电薄膜表面与界面的电势及电畴等微区性质。
5) SFM
扫描力显微镜
1.
Michelson interferometer is used as basic platform to set up a SFM/SNOM experiment system,which could be used in principle experiment of SFM/SNOM.
以迈克耳孙干涉仪作为基本操作平台建立了扫描力显微镜/扫描近场光学显微镜(SFM/SNOM)实验系统。
2.
A method for such calibration with metrological large range scanning force microscope(M-LRSFM),developed by physikalisch-technische bundesanstalt(PTB) with capable measurement volume of 25 mm×25 mm ×5 mm, is introduced.
介绍了应用由德国联邦物理研究所开发研究的、测量范围为25 mm×25 mm×5 mm的计量型扫描力显微镜(M-LRSFM)的校准方法。
3.
Wavelet transform used in SFM image was described according to its properties.
根据扫描力显微镜的特点,对小波变换应用于扫描力显微镜图像的降噪、增强及融合方法进行了阐述。
6) scanning force microscopy
扫描力显微术
1.
Glass-to-rubber transition of polymer film analyzed by scanning force microscopy;
扫描力显微术在高聚物薄膜玻璃化转变研究中的应用
2.
Nanoscale domain structures and polarization reversal behaviour in (111) oriented PZT60/40 thin film were investigated in situ with scanning force microscopy piezoresponse mode.
利用扫描力显微术中压电响应模式原位研究了 (111)择优取向的PZT6 0 4 0铁电薄膜的纳米尺度畴结构及其极化反转行为 。
补充资料：扫描电子显微镜(见扫描电子显微术)
扫描电子显微镜(见扫描电子显微术)
scanning eleetron mieroseoPe
扫描电子显微镜scanning eleetron mieroseope见扫描电子显微术。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条