1) Complex ray
复射线束展开
2) water plugging and combined perforation
堵水复射
3) complex ray
复射线
1.
Plane aperture radiation model of a complex ray and its significance;
复射线的平面口径辐射模型及其意义
2.
The electromagnetic transmission performance of a 2-D cylindrical magnetic radome is analyzed by complex ray paraxial approximation method in this paper.
利用复射线近轴近似法分析二维圆柱形磁性天线罩的电磁传输特性。
3.
With an analytical extension from real space into complex one,the coordinates of thesource point and the rays will be changed into complex space respectively,In this paper,thephysical meaning of the complex source point(CSP)and the complex ray(CR),as well as the mathematical procedure in the related methods are discuased.
本文较为全面地介绍了复源点和复射线的概念,并对复源点和复射线的物理含义及有关方法的数学依据进行了探讨,这将有助于对相关问题的更好理解。
4) reflecting
复射式
1.
This paper presents the structure of a new light lever-reflectinglight lever, and conducts acomparison experiment of Young s elastic modulus measured by the new and old light lever respectivelyand gives measuring results and error.
本文给出了一种新式光杠杆——复射式光杠杆的结构,并用新旧两种光杠杆测定杨氏弹性模量进行了对比实验,给出了测量结果及误差。
5) comlpex ray method
复射线法
6) hybrid enhanced perforator
双复射孔器
1.
The hybrid enhanced perforator mainly consists of hybrid enhanced expendable hollow carrier and hybrid enhanced shaped charges, available in two types: one with the deep-penetrating feature is adept in high permeability reservoir; another with the additional propellant is adept in medium, low permeability reservoir.
双复射孔器由复式射孔枪和复式射孔弹组成。
参考词条
补充资料:微束质子X射线荧光分析
分子式:
CAS号:
性质:又称微束质子X射线荧光(micro PIXE)分析或质子显微镜(proton microscope)分析。系用微米质子束对样品进行微区扫描的元素分析技术。基本原理是将高速质子束准直、聚焦或微米束轰击样品,质子与样品原子相互作用产生特征X射线,用Si(Li)探测器测定样品中元素的含量。特点是样品用量少(几个μm3)、灵敏度高(比扫描电镜高2~3个数量级)、检测限低(1×106~10×106)、精确度为10%~20%、空间分辨率为0.5~10μm,为非破坏性多元素(20~30个)同时分析,并可二维扫描,获得微区或一个点(~1μm)上的元素分布信息。近年来此技术在环境样品中如大气颗粒物(飞灰、煤尘)单个颗粒的元素分析也得到了应用。SPM是当代物理分析的高新技术,其应用范围及作用将日益扩大。
CAS号:
性质:又称微束质子X射线荧光(micro PIXE)分析或质子显微镜(proton microscope)分析。系用微米质子束对样品进行微区扫描的元素分析技术。基本原理是将高速质子束准直、聚焦或微米束轰击样品,质子与样品原子相互作用产生特征X射线,用Si(Li)探测器测定样品中元素的含量。特点是样品用量少(几个μm3)、灵敏度高(比扫描电镜高2~3个数量级)、检测限低(1×106~10×106)、精确度为10%~20%、空间分辨率为0.5~10μm,为非破坏性多元素(20~30个)同时分析,并可二维扫描,获得微区或一个点(~1μm)上的元素分布信息。近年来此技术在环境样品中如大气颗粒物(飞灰、煤尘)单个颗粒的元素分析也得到了应用。SPM是当代物理分析的高新技术,其应用范围及作用将日益扩大。
说明:补充资料仅用于学习参考,请勿用于其它任何用途。