1) polished silicon wafer
抛光硅片
1.
In this work, the iron contamination on the polished silicon wafers fabricated by different procedures has been probed by SPV, and then the dominant iron contamination sources during the fabrication process have been found.
本文通过SPV法测试不同流程制造的P型抛光硅片中的铁沾污 ,找到了在P型抛光硅片制造工艺过程中引入铁沾污的主要来源。
3) silicon slice polishing liquid
硅片抛光液
5) mirror polished silicon
镜面抛光硅片
6) polished SiC single crystal wafer
碳化硅抛光片
补充资料:硅片抛光机
硅片抛光机
硅片抛光机
说明:补充资料仅用于学习参考,请勿用于其它任何用途。
参考词条