说明:双击或选中下面任意单词,将显示该词的音标、读音、翻译等;选中中文或多个词,将显示翻译。
您的位置:首页 -> 词典 -> 激光沉积法
1)  pulsed laser deposition
激光沉积法
2)  pulsed laser deposition
脉冲激光沉积法
1.
Recent advances on ZnO-based films synthesized by pulsed laser deposition;
脉冲激光沉积法制备ZnO基薄膜研究进展
2.
The even single phase βFeSi_2 thin films were prepared by femtosecond pulsed laser deposition(PLD) on Si(111) wafers at different temperature using an FeSi_2 alloy target,and excimer(nanosecond) PLD was introduced to prepared β-FeSi_2 thin films also.
用FeSi2合金靶作为靶材,采用准分子激光沉积法在Si(111)单晶基片上制备了单相的-βFeSi2薄膜,并将飞秒脉冲激光沉积法(PLD)引入到-βFeSi2薄膜的制备工艺中;用X射线衍射仪(XRD),场扫描电镜(FSEM),能谱仪(EDS),紫外可见光光谱仪研究了薄膜的结构、组分、表面形貌和光学性能。
3.
5CoO3(LSCO) oxide thin films were realized on SrTiO3(001) substrates by pulsed laser deposition.
利用脉冲激光沉积法在STO(001)基片上外延生长了La0。
3)  laser deposition
激光沉积
1.
The behaviors of the Nb,Ti,Al mixed powder stream concentration from a coaxial laser deposition nozzle and the molten pool in laser deposition process in the controlled environment chamber have been observed and analyzed with a charge coupled device(CCD) camera.
根据微粒光散射理论对CCD拍摄的粉末流图像进行分析,得出了不同位置处粉末流的分布模型,并结合实验获取了用于激光沉积的同轴送粉喷嘴到沉积表面的适用距离区间。
2.
Buffer layers of MgO(or CeO2)were first deposited on silicon substrates,and then BaTiO3(BTO)ferroelectric films were formed again by pulsed laser deposition.
采用脉冲激光沉积方法,在硅基片上先沉积 MgO 或 CeO2缓冲层后再制备 BaTiO3 (BTO)铁电薄膜。
3.
Nanocomposite films composed of Ag particles embedded in BaTiO_3 matrix were grown on MgO(100) substrates by pulsed laser deposition.
在MgO(100)基片上利用脉冲激光沉积技术制备了掺有Ag纳米颗粒的BaTiO3复合薄膜。
4)  laser induced chemical vapor depostion method
激光化学气相沉积法
5)  pulsed laser deposition method
脉冲激光气相沉积法
1.
02) dilute magnetic semiconductor thin films deposited on Si (001) substrates at 650℃ by pulsed laser deposition method were studied by X-ray absorption fine structure,X-ray diffraction and magnetic measurement.
利用X射线吸收精细结构、X射线衍射和磁性测量等技术研究脉冲激光气相沉积法制备的Zn1-xCoxO(x=0。
6)  pulsed laser deposition
脉冲激光沉积法(PLD)
补充资料:激光化学气相沉积
分子式:
CAS号:

性质: 利用激光束的光子能量激发和促进化学气相反应的沉积薄膜方法。在光子的作用下,气相中的分子发生分解,原子被激活,在衬底上形成薄膜。这种方法与常规的化学气相沉积(CVD)相比,可以大大降低衬底的温度,防止衬底中杂质分布截面受到破坏,可在不能承受高温的衬底上合成薄膜。与等离子体化学气相沉积方法相比,可以避免高能粒子辐照在薄膜中造成损伤。本方法所用设备是在常规的化学气相沉积设备基础上添加激光器、光路系统及激光功率测量装置。用本方法制备的SiO2及Si3N4薄膜时,衬底温度可低至380℃。

说明:补充资料仅用于学习参考,请勿用于其它任何用途。
参考词条