1) thickness measurement
膜厚测量
1.
Analyzes in detail the principle of thickness measurement of metallic waveguide iris by means of the electromagnetic field theory.
运用电磁场理论对金属波导膜厚测量的原理进行了详细分析,并且研制了一台膜厚测量仪,理论和实践表明:可以通过测量复合金属波导膜系励磁电流的脉冲波形来控制薄膜的生长厚度。
2) film thickness measurement
膜厚测量
3) equipment for measuring thickness of films
膜厚测量仪
4) nanometer film thickness measurement
纳米膜厚测量
5) Micromeasurement of film thickness
微区膜厚测量
