1) linear defect
![点击朗读](/dictall/images/read.gif)
线状缺陷
1.
Causes of linear defects on the surface of cold-rolled sheet:analysis and discussion
![点击朗读](/dictall/images/read.gif)
冷轧板表面线状缺陷成因分析与探讨
2.
The surface linear defects of 45# steel bolts have been analyzed by macrostructure examination,metallography and electron probe micro-analyzer.
针对45#钢螺栓表面线状缺陷进行了低倍、金相、电子探针等检测分析,结果表明,线状缺陷由大型夹渣造成,其主要成分为SiO2、CaO、Al2O3、Na2O,系连铸过程中酸性钢水中包覆盖剂卷入所致。
2) planar defect
![点击朗读](/dictall/images/read.gif)
面状缺陷
1.
Enhancement of an ultrasonic B scan image of planar defect;
![点击朗读](/dictall/images/read.gif)
面状缺陷超声B扫描检测图像增强研究
2.
Characteristic and recognition of ultrasonic TOFD signal and image for planar defect;
![点击朗读](/dictall/images/read.gif)
面状缺陷超声TOFD法信号和图像的特征与识别
3) spot like defects
![点击朗读](/dictall/images/read.gif)
斑状缺陷
4) needle_like defect
![点击朗读](/dictall/images/read.gif)
针状缺陷
5) haze defect
![点击朗读](/dictall/images/read.gif)
雾状缺陷
1.
The haze defect shows more serious status during the lithography process coming to 193 nm wavelength.
在光刻波长进入到193 nm之后,雾状缺陷(haze defect)越发严重,研究发现环境是雾状缺陷产生的重要原因。
6) platelet defect
![点击朗读](/dictall/images/read.gif)
片状缺陷
1.
Determination of structural characteristics and depth profile of platelet defects in hydrogen-implanted silicon wafers by HREM;
注氢硅片中片状缺陷的结构特征及其深度分布的高分辨电镜研究
补充资料:点缺陷(见晶体缺陷)
点缺陷(见晶体缺陷)
point defect
点缺陷point defeet见晶体缺陷。
说明:补充资料仅用于学习参考,请勿用于其它任何用途。
参考词条