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1)  X-ray electron probe microanalysis techniques
X射线电子探针显微分析技术
1.
Through environmental scanning electron microscopy combined with X-ray electron probe microanalysis techniques, 10 kinds of metal content (Al, Cd, Cr, Pb, Mg, P, S, K , Ca, Si) were determined respectively in 6 sites of 23 kinds of different genotypes rice grain including inside and o
通过环境扫描电镜结合X射线电子探针显微分析技术,对23种不同基因型水稻籽粒颖壳内、外表面、颖果表面、糊粉层、亚糊粉层、中心胚乳6个部位和20种不同基因型小麦籽粒皮层、糊粉层、盾片、胚芽、胚轴、胚根、内胚乳7个部位的10种金属含量(分别为Al、Cd、Cr、Pb、Mg、P、S、K、Ca、Si)进行测定。
2)  X-ray electron probe microanalysis
X射线电子探针显微分析
1.
By means of environmental scanning electron microscopy and X-ray electron probe microanalysis,the relationships between relative content of P and those of Al,Cd and Pb in different parts of rice grains were studied.
利用环境扫描电镜结合X射线电子探针显微分析技术,研究了水稻籽粒不同部位P与Al、Cd、Pb含量的关系。
2.
In the present study,the Si levels of 22 oat genotypes in 4 different grain parts (the cortex,aleuronic layer,near aleuronic layer and center of caryopsis) were determined by environmental scanning electron microscopy combining with X-ray electron probe microanalysis,and its relevancy with the contents of other metals in the whole oat grain,including P,Mg,K,Ca,S,Cd,Al and Pb,were analysed.
通过环境扫描电镜结合X射线电子探针显微分析技术,对22个基因型的燕麦籽粒皮层、糊粉层、近糊粉层和颖果中部的Si含量进行测定。
3)  electron probe X-ray micro-analyzer
电子探针X射线显微分析仪
4)  electron microprobe X-ray analyzer
电子显微探针X射线分析仪
5)  electron microscopy and electron probe X-ray microanalzer
电镜及电子探针X射线微量分析
6)  electroprobe X ray microanalyzer
电子探针X射线分析仪
补充资料:电子探针显微分析
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性质:又称电子探针显微分析。试样非破坏性微区化学元素定性定量分析方法。试样直径在1μm、体积为1μm3范围,以直径0.1~1μm的电子束激发,其中各种元素受激发射出特征X射线。以此确定微区中所含化学元素,并根据其强度进行定量分析。可用显微镜确定试样某一位置上的组分及组分的空间分布。

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