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1)  WD-EPXMA
电子探针X射线波谱分析
2)  electroprobe X ray microanalyzer
电子探针X射线分析仪
3)  electron probe X-ray analyzer
电子探针X射线分析器
4)  electron microscopy and electron probe X-ray microanalzer
电镜及电子探针X射线微量分析
5)  Electronic probe X-ray microregion analysis
电子探针X射线微区分析
例句>>
6)  X-ray electron probe microanalysis
X射线电子探针显微分析
1.
By means of environmental scanning electron microscopy and X-ray electron probe microanalysis,the relationships between relative content of P and those of Al,Cd and Pb in different parts of rice grains were studied.
利用环境扫描电镜结合X射线电子探针显微分析技术,研究了水稻籽粒不同部位P与Al、Cd、Pb含量的关系。
2.
In the present study,the Si levels of 22 oat genotypes in 4 different grain parts (the cortex,aleuronic layer,near aleuronic layer and center of caryopsis) were determined by environmental scanning electron microscopy combining with X-ray electron probe microanalysis,and its relevancy with the contents of other metals in the whole oat grain,including P,Mg,K,Ca,S,Cd,Al and Pb,were analysed.
通过环境扫描电镜结合X射线电子探针显微分析技术,对22个基因型的燕麦籽粒皮层、糊粉层、近糊粉层和颖果中部的Si含量进行测定。
补充资料：电子探针(见电子探针显微分析)


电子探针(见电子探针显微分析)
electron probe

气二J一，不f丁electron orobom由不，‘.，*二
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
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