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1)  X beam member diffraction meter
X射线分子衍射仪
2)  high resolution X-ray diffractometry
高分辨X射线衍射仪
3)  XRD
X射线衍射仪
1.
Maintenance and Service about the Detecting System of the Cooling Water for XRD in D/max-r Series;
D/max-r X射线衍射仪冷却水检测系统的检修
2.
The surface morphology,chemical composition,film grain size as well as the film crystallization of particles were analyzed by field emission scanning electron microscopy(FESEM),energy dispersive spectroscopy(EDS),inductively coupled plasma-atom emission spectrometer(ICP-AES) and X-ray diffraction(XRD) respectively before and after the plating process.
重点讨论了不同的沉积条件对薄膜结晶的影响,并用X射线衍射仪(XRD)对其进行了表征。
3.
The nc-Si films were characterized by the Raman spectroscopy,X-ray dif-fraction spectroscopy(XRD),transmission electron microscopy(TEM) and atom force microscope(AFM),respectively.
利用拉曼(Raman)光谱仪、X射线衍射仪(XRD)、透射电子显微镜(TEM)以及原子力显微镜(AFM)等测试仪器对nc-Si薄膜进行表征,发现制备的nc-Si量子点排列紧密、尺寸均匀,具有很好的单晶结构,制备的nc-Si薄膜晶化比例很高,并且优先选择在[111]方向晶化。
4)  X-ray diffraction
X射线衍射仪
1.
Scanning electron microscopy,X-ray diffraction and laser particle size analyzer were used to carry out a micromeasurement of the powder.
采用快速凝固/机械球磨法制备钛合金粉末;并采用扫描电子显微镜、X射线衍射仪和激光粒度分析仪对其进行微观测量。
2.
According to the results of scanning electron microscope and X-ray diffraction analysis, microstructures are different during laser sintering with different powers; however, sintered materials with nano-structure can be acquired at last.
利用电子扫描电镜(SEM)和X射线衍射仪(XRD)对激光烧结纳米Al2O3粉末块体材料进行了试验分析与研究。
3.
Basic principle, experiment condition, operating process, method and steps of X-ray diffraction method to determine free silica content of respirable dust in mines are introduced in this paper.
本文介绍了应用X射线衍射仪测定矿山呼吸性粉尘中游离二氧化硅含量的基本原理、实验条件以及操作过程、方法步骤等。
5)  X-ray diffractometer
X射线衍射仪
1.
A Modification Method of X-Ray Diffractometer Controlled with Microcomputer on Windows XP;
X射线衍射仪Windows XP微机化改造新方法
2.
We can "see" atom and molecule by single crystal X-ray diffractometer;
单晶X射线衍射仪可以让我们“看见”原子和分子
3.
Building high grade service sharing platform of X-ray diffractometers to cultivate creative talent;
为培养创新人才构筑X射线衍射仪优质资源共享服务平台
6)  x-ray diffraction instrument
X射线衍射仪
1.
Data controller hardware design of X-Ray diffraction instrument;
X射线衍射仪控制器的硬件设计
2.
The paper introduced a kind of advanced object shadow analysis method to samples of the crystal or powders with x-ray diffraction instrument,it has exetensive application in field of science and research, as well as practical inspection test.
介绍一种用先进的X射线衍射仪对晶体或粉末样品进行物相分析的方法,对科研及常规鉴别试验工作具有较高的推广价值。
补充资料:X射线衍射仪
      利用计数器来收集晶体衍射方向和衍射强度数据,进行物相鉴定或晶体结构分析的仪器(图1)。有多晶X射线衍射仪和单晶四圆 X射线衍射仪。X射线衍射仪由X射线发生器、测角仪和探测记录系统等 3部分组成(图2)。其工作原理是:粉末样品经一束平行的单色 X射线垂直照射后,产生一组以入射线为轴的同轴反射圆锥面族,计数管绕样品旋转,依次测量各反射圆锥面2θ角(即衍射角,又称布喇格角)位置的衍射线强度,即可获得表征物相的各种衍射数据,从而进行物相鉴定和晶体结构的研究。  X射线衍射仪是矿物学研究领域内的主要仪器,用于对结晶物质的定性和定量分析,还可确定类质同象混晶(固溶体)的成分,有限固溶体的固溶极限,区分晶质和非晶质结构的变化。测定晶体的有序-无序结构及其有序度,以及粘土矿物的混层结构等。
  

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