Examination of X-ray photoelectron spectroscopy(XPS) demonstrated that the peak of Al(2p) on polyacetal grafted Al_2O_3 surfaces(almost) disappeared, while that of O(1s) increased.

The working principles of several advanced surface analysis instrument including X-ray photoelectron spectroscopy(XPS),atomic force microscopy(AFM) and time of flight secondary ion mass spectroscopy(ToF-SIMS) are introduced, their successful application in fiber surface analysis recent years is reviewed.

The surface morphology, composition and structure character of the Fe-N-O thin films were studied by scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS) and transmission electron microscopy (TEM).

The XRD spectra and XPS spectra were measured for Sr doped La 1- x Sr x CoO 3 materials with perovskite structure prepared by the solid state reaction method.

XPS spectra are obtained for the bleached and coloured statos in Ni2p3/2 and O1s regions.

Performance analysis and application research on XPS board

In this article,authors analyse all kinds of reasons which influence the bending resistance ability of XPS insulating boards,and show the actual experimental method to test bending resistance ability of XPS boards.

But it must be noted that XPS board has its own weaknesses, such as high shrinkage,easily warping,inferior adhesive property caused by smooth surface,and peeling off induced by deformation.

The analysis of XPS spectrum of thin films formed by Cu cluster beam deposited onto Si substrate;