1) density of trapping charges
陷阱电荷密度
1.
A method for measuring the density of trapping charges in thin gate oxides;
薄栅氧化层中陷阱电荷密度的测量方法
2) trapped charges
陷阱电荷
1.
The distribution of trapped charges and the relationship between the displacement of movable grating and applied voltage are analyzed in detail An e.
结构中SiO2绝缘层在外加电场作用下产生陷阱电荷,对器件的驱动特性产生影响。
3) charge traps
电荷陷阱
1.
In order to characterize accurately the distribution of charge traps on energy in polymer dielectric materials by using Photon-stimulated Discharge(PSD) Spectra,the raw PSD Spectra need to be normalized by the energy of light excitation.
为了利用光激电流谱准确地表征聚合物电介质材料中的电荷陷阱密度按能量分布的情况,需要将原始光激电流谱对光激发能量进行归一化。
4) trap density
陷阱密度
1.
TDDB evaluation experiments are implemented on the thin gate oxides MOS capacitor,and a method of precise measurement and characterization the trap density and accumulative failure are presented.
采用恒定电流应力对薄栅氧化层 MOS电容进行了 TDDB评价实验 ,提出了精确测量和表征陷阱密度及累积失效率的方法 。
5) trap state density
陷阱态密度
6) trapped charge limited(TCL)
陷阱电荷限制(TCL)
补充资料：流动性偏好陷阱或凯恩斯陷阱（Keynes trap）
流动性偏好陷阱或凯恩斯陷阱（Keynes trap）：当利率极低，人们会认为这种利率不大可能再降，或者说有价证券市场价格不大可能上升而只会跌落时，人们不管有多少货币都愿意持在手中，这种情况被称为%26#8220;凯恩斯陷阱%26#8221;或%26#8220;流动偏好陷阱%26#8221;。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条