This paper introduced and desinged an interface circuit by means of large scale integrated circuit PMM8713.

A compilation/generation method for test program of large scale integrated circuit (LSI), called Fault Simulation Method is presented in this paper.

Research on Parallel Seam Sealing Process for LSI;

A kind of super purification control system which can realize the high spotless environment for LSI s manufacturing is introduced.

The method will make the circuit more terse and reliable by using the LSI is pLSI1016 chip of lattice corporation as the core.

Our algorithm not only avoids polynomial deflation but also is more efficient than traditional rootfinding algorithm and it is fit for being realized by VLSI.

With the appearance of VLSI ATE,Auto test technology has been wide used,So production of IC validation is efficiency,This paper has introduced the typical flow of test in IC electric parameter,Then explain the basic principle of test and imaginable result.

With the development of VLSI(Very Large Scale Integration), the integrity becomes larger and larger, from hundreds of thousand to millions or tens of millions, and it becomes more difficult to finish the verification task.

Test methods of total dose effects in very large scale integrated circuits;