Research on VLSI Gridless Routing Algorithm;

Application and Advances of Reliability Technology in VLSI;

Research on Power Grid Integrity Analysis of VLSI;

Copper Electrodeposition in ULSI;

Study on Polishing Slurry for Silicon Substrate in ULSI;

An Energy Transfer Photochemical Model for the Abatement of Total Organic Carbon in High Purity Water Used in ULSI Fabrication;

The three methods and their very large scale integration(VLSI)implementation were presented,including frequency distill method,amplitude modulation demodulate method and Harr wavelet method.

A fast and efficient very large scale integration(VLSI) architecture for two-dimensional discrete wavelet transform was proposed,which is a 4-input/4-output architecture.

Based on the principle that it is possible to test minuteness displacement and deformation with electronic speckle pattern interferometry (ESPI),the heat reliability of very large scale integration (VLSI) is tested.

With the development of Very Large Scale Integrated circuit, circuit scale is more and more large, complexity is more and more serious, which has become a huge challenge to Electronic Design Automation.