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1)  Aluminum film
铝薄膜
1.
Auger electron spectroscopy (AES) analysis shows there is a significant diffusion and chemical reactions take place in the interface between metal uranium and aluminum film produced with circulated argon ion bombardment process, which results in the formation of UAl 3 and Al 2O 3 phases.
以磁控溅射沉积方法 ,采用循环氩离子轰击镀和未循环轰击镀工艺在金属铀上制备了铝薄膜
2)  Al thin film
铝薄膜
1.
Process technology for Al thin film deposited by DC magnetron sputtering;
直流磁控溅射制备铝薄膜的工艺研究
2.
The results show that the Al thin films are pure aluminum film with very fine grain.
采用直流磁控溅射法,在硅基片上制备铝薄膜
3.
Process of Al thin film growth and its interaction with UO2 were investigated by auger electron spectroscopy(AES) and electron energy loss spectroscopy(EELS).
沉积过程中实时采集UO2表面的AES谱和低能电子损失谱(EELS),原位分析铝薄膜在UO2表面的生长过程和膜间界面反应。
3)  aluminum thin film
铝薄膜
1.
Determination of optical constants for aluminum thin film based on combined optimal algorism;
基于混合优化算法测定铝薄膜光学常数
4)  Metallized films
镀铝薄膜
5)  Ultrathin Al film
超薄铝膜
6)  Al foil target
铝薄膜靶
补充资料:真空镀铝薄膜
分子式:
CAS号:

性质:一类镀铝的塑料薄膜包装材料。呈多种颜色金属光泽,具有相应的铝箔的特性。多以聚酯、尼龙、聚丙烯、低密度聚乙烯薄膜为基材,在真空室内,使加热成蒸气的金属铝冷凝在基材上而成。镀层厚度约0.025μm,但性能可似铝箔,代替铝箔应用于食品薄膜包装,可大量节约用铝。

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