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1)  Piezoresponse scanning force microscopy
压电力显微镜
1.
Piezoresponse scanning force microscopy was used to observe the nanoscale f
近年来在AFM基础上发展起来的压电力显微镜(Piezoresponse-SFM,PFM)为铁电畴的研究提供了一种强有力的手段。
2)  piezoresponse force microscopy
压电响应力显微镜
1.
Study on ferroelectric domain's growth of(Pb,La)TiO_3 films by piezoresponse force microscopy;
(Pb,La)TiO_3薄膜电畴生长的压电响应力显微镜研究
3)  high voltage electron microscope
高压电子显微镜
4)  electrostatic force microscope
静电力显微镜
1.
Several controlled experiments were preformed and the surface charges were measured by electrostatic force microscope.
为进一步研究聚合物电介质材料聚酰亚胺表面电荷的生成规律和特性,利用Dimension 3100型扫描探针显微镜在微纳米尺度下对聚酰亚胺表面进行摩擦产生了电荷,并用静电力显微镜观察了电荷的消散过程。
5)  EFM
静电力显微镜
1.
Surface charges in micro-nanometer scale were prepared on the surface of polymethyl methacrylate(PMMA)films by carving the surface with conductive SPM probe,and these generated charges were observed with electrostatic field microscope(EFM).
利用扫描探针显微镜(SPM)的导电探针在PMMA薄膜表面μm/nm尺度下通过摩擦方式产生了电荷,并用静电力显微镜(EFM)对生成的电荷进行了观察。
2.
By operating an ac modulation bias on the mini tip of the needle sensor, based on atomic force microscope using tuning fork, we have achieved a dynamic non contact mode EFM with high spatial resolution.
在一台基于微晶振的原子力显微镜的基础上 ,通过在针式传感器前端细小针尖加入可调交流偏压 ,获得高分辨率动态非接触静电力显微镜。
6)  atmospheric scanning electron microscope
大气压扫描电子显微镜
补充资料:显微镜19世纪中期的显微镜




显微镜  19世纪中期的显微镜
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