In order to solve this problem,a new method for designing BIT fault diagnosis strategy for fault-tolerant systems,considering reliability and testing costs,was proposed based on dynamic fault tree model.

A fault-tolerant system experiences a crash due to hardware components faults or progressive performance degradation as an"aging"phenomenon,because of running continuously for very long periods.

By the example of applying it on the(N+M) fault-tolerant system,analyzes its performance,results show the search efficiency and accuracy of improved particle swarm optimization algorithm are better than general.

In this paper (N+M) fault tolerant systems are studied theoretically.

The basic principle about dynamically re configurable FPGA was introduced and an new design method about the fault tolerant system of digital circuits was presented.

N+M) fault tolerant system (FTS) makes full use of the hardware and software of its own, and intelligent networking is a practical way to implement it, so that it is expected to have wide application in control systems.

But it can not be use d to analyze the reliability of fault tolerant systems.

Research on Double Disks Fault Tolerant RAID Based on Multi-thread I/O Technology;