1) intensity convolution integral
强度卷积积分
2) integrated intensity
积分强度
1.
Approximate expression of integrated intensity in X-ray diffraction experiment;
X光衍射中积分强度的近似公式
2.
Besides,the quantitative analysis method by all peaks seperation in whole pattern and another method by integrated intensity,which can solve the peak overlay problem,are included in this so.
建立了不涉及结构的多晶X射线衍射全谱拟合定量分析方法、相关定量分析方法及其中文视窗版应用程序,其中包括PDF2组合全谱拟合定量分析法、自定义卡片组合全谱拟合定量分析法、自测各单相谱组合全谱拟合法,以及全谱峰分离定量分析法和积分强度K值定量分析法。
3.
In order to measure the resolving time, the method of double irradiation on monolayer film is given, and the approximate expression to correct integrated intensity is derived.
为了简便地测定分辨时间 ,本文利用单层膜二次照射技术 ,导出了用来校正积分强度的近似公式 ,并与逐点校正法作了对比分析 ,二者符合很
3) convolution integral
卷积积分
1.
The main idea behind this method was firstly to utilize convolution integral to calculate pointwise curvature through resampling the contour in multiscale space, and then the feature points were selected.
该方法的基本思想是首先采用卷积积分的方法 ,在多尺度空间里通过对轮廓进行重采样来计算轮廓上每一点的曲率并选取特征点。
2.
There are two difficult points in convolution integral: how to determine the limit of the integral, and the integrands on the convolution integral.
确定卷积积分的积分限和在相应区间上的被积函数是计算卷积积分的两个难点。
3.
The zero state response to an arbitrary excitation in a fist order circuit can be solved by either the convolution integral or the three element method.
一阶电路在任意激励下的零状态响应，既可以用卷积积分法，也可以用三要素法进行分析与计算。
5) convolution integration
卷积积分
1.
The near\|field scattering characteristics for the conduct plate is studied by using of the physics optics method, and a calculation method of convolution integration for near field scattering is discussed.
用物理光学法研究导电平板目标近场散射特性，为了提高计算效率，文中采用了卷积积分法。
补充资料：表光合强度(见光合强度)
表光合强度(见光合强度)
forecast of sowing or transplanting time
b iaoguanghe qiangdu表光合强度见光合强度
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条