1) derivometer
[deri'vɔmitə]
测偏仪
2) Partiality instrument
偏心测压仪
3) ellipsometric porosimetry (EP)
椭偏测孔仪
1.
Small angle neutron and X-ray scattering (SANS,SAXS) combined with specular X-ray reflectivity (SXR),ellipsometric porosimetry (EP),positron (positronium) annihilation spectroscopy (PAS) and surface acoustic wave spectroscopy (SAWS) have recently been developed for this.
近年来开展了利用与特殊X射线反射联用的小角中子散射、小角X 射线散射、椭偏测孔仪、正电子湮没谱和表面声波谱等非破坏性方法表征多孔低介电常数薄膜孔结构的研究。
5) ellipsometer
[,elip'sɔmitə]
椭偏测厚仪
1.
The analyses of confirming the film thickness by the ellipsometer;
椭偏测厚仪确定薄膜真实厚度的分析
2.
Thickness measurement of transparent optoelectronic films with combination of spectrometer and ellipsometer;
紫外可见吸收光谱仪与椭偏测厚仪联用测量透明光电子薄膜的厚度
3.
The problems in the ellipsometer experiment are analyzed.
分析了高校椭偏测厚实验中存在的问题 ,成功研制出具有教学特点的多功能智能椭偏测厚仪和编制了一套该实验的CAI课件 。
6) deflectometer
[di,flek'tɔmitə]
偏斜测定仪
补充资料：无弹性架压磁测力传感器压头
无弹性架压磁测力传感器压头
无弹性架压碰测力传感器压头
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条