1) thin beam scan
细光束扫描
1.
In this paper a new measure method is described--- the technique of thin beam scan to measure the distributing of refraction ratio of section plane of polymer optical fiber.
本文主要研究了一种新的测量方法——细光束扫描来测量光线预制棒的折射率分布。
3) beam deflector
光束扫描器
1.
Based on the optical characteristics of lead lanthanum zirconate titanate(PLZT) electro-optic ceramic,an optical phased-array beam deflector with up-down electrode structure′s transverse electro-optic effect was proposed.
基于掺镧锆钛酸铅(PLZT)电光陶瓷材料的光学特性,提出了一种具有上下电极结构的光学相控阵高速光束扫描器。
5) multibeam scanning
多光束扫描
1.
Based on the theory of geometric optics, the synthesis aberration equation of multibeam scanning and imaging system is derived.
根据几何光学理论,导出多光束扫描成像的综合像差方程,分析了导致离轴扫描线像差的入射光线与成像系统光轴夹角、转镜面数等因素,并研究了各单项像差的权重因子。
6) microscanning
细光栅扫描
补充资料：扫描电子显微镜(见扫描电子显微术)
扫描电子显微镜(见扫描电子显微术)
scanning eleetron mieroseoPe
扫描电子显微镜scanning eleetron mieroseope见扫描电子显微术。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条