1) Z-scan technique
单光束扫描法
1.
During the measurement of optical nonlinearities of sample in the thill film by Z-scan technique, ablating makes a hole in the thin film if the incidental laser power is too high, that will produce the error to measurement results.
用单光束扫描法研究薄膜材料的非线性光学性质时，如果入射样品的激光功率过大，将会烧蚀薄膜而产生孔洞，虽然其归一化透过率曲线类似于没有烧蚀的情况，但与样品的非线性光学性质无关，因而造成测量结果错误。
2) two beam scan technique
双光束扫描法
1.
The index change of DR1/PMMA film was measured by two beam scan technique.
用双光束扫描法研究了在 488nm的Ar+ 激光照射下 ,聚合物材料PMMA DR1的光漂白过程 ,为精确测量光漂白模型中的参数提供了一种简单实验方法。
4) beam-scanning method
束扫描法
5) beam deflector
光束扫描器
1.
Based on the optical characteristics of lead lanthanum zirconate titanate(PLZT) electro-optic ceramic,an optical phased-array beam deflector with up-down electrode structure′s transverse electro-optic effect was proposed.
基于掺镧锆钛酸铅(PLZT)电光陶瓷材料的光学特性,提出了一种具有上下电极结构的光学相控阵高速光束扫描器。
补充资料：单光束散斑干涉法
见散斑干涉法。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条