1) debugging architecture
可调试性设计
2) Design for Debug
可调试设计
1.
Adding the DfD (Design for Debug) to improve the observability and controllability of SoC becomes more and more important.
所以，对于片上系统设计，加入可调试设计以提高芯片内部的可观察性和可控制性变得非常重要，已成为SoC中一个重大的研究课题。
3) Design for testability
可测试性设计
1.
Because of the high integration characteristic of resonant tunneling diode (RTD) circuits, design for testability is significantly important to simplify the RTD circuits testing.
针对共振隧穿二极管(RTD)电路由于具有超高集成度特点所带来的电路测试困难,在故障分析与故障模型的基础上提出了RTD电路的可测试性设计方案。
2.
Boundary Scan Technique (BST) is a new and effective way of test and design for testability for VLSI circuits.
1边界扫描机制是一种新型的VLSI电路测试及可测试性设计的有效方法,为了高效地应用边界扫描机制对电路系统进行测试,必须对其所涉及的理论方法进行深入探讨。
3.
The idea of test and design for testability is discussed, the challenges of test and design for testability are analyzed, then the test and design for testability in SOC design are discussed.
CMOS器件进入超深亚微米阶段,集成电路(IC)继续向高集成度、高速度、低功耗发展,使得IC在测试和可测试性设计上都面临新的挑战。
4) design-for-testability
可测试性设计
1.
A comprehensive survey of the up-to-date design-for-testability (DFT) methods and testing technologies for system-on-a-chip (SOC) is presented.
对SOC可测试性设计与测试技术的国际研究现状及进展进行了广泛而深入的综述。
5) DFT
可测试性设计
1.
SoC DFT Design Based on Function and ESL Debug;
基于功能的SoC可测试性设计及系统级调试
2.
Research on DFT Techniques for a Kind of Intelligent Communication Board;
一种智能通信板的可测试性设计研究
3.
Aiming at the difficult situation of the inspecting and test system of “ground to air” missile,the means of design for testability (DFT) in “ground to air” missile based on the technology of DFT are introduced.
阐述了地空导弹武器系统可测试性设计的必要性 ,论述了可测性设计的基本理论 ,分析了地空导弹武器系统可测性设计涉及的相关问题。
补充资料：连续性与非连续性(见间断性与不间断性)
连续性与非连续性(见间断性与不间断性)
continuity and discontinuity
11an父ux泊g四f“山。麻以角g、.连续性与非连续性(c。nt，n琳t:nuity一)_见间断性与不间断性。and diseo红ti-
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条