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1)  GI-XRF
掠入射X射线荧光
1.
Grazing Incidence X-Ray Fluorescence (GI-XRF) analysis system and Grazing Exit X-Ray Fluorescence (GE-XRF) analysis system, which are based upon the conventional X-Ray Fluorescence (XRF) and related to the X-Ray Total Reflection phenomenons, have been designed and constructed.
基于X射线全反射现象,在常规X射线荧光分析的基础上成功研制了用于薄膜多层膜元素深度分布研究和微结构表征的掠入射X射线荧光(GI-XRF)分析系统及掠出射X射线荧光(GE-XRF)分析系统。
2)  grazing-exit X-ray fluorescence
掠出射X射线荧光
1.
The self-produced grazing-exit X-ray fluorescence platform is proved with high repetition and stability,and the design of experimental arrangement is reasonable,by studying the repetition of grazing-exit X-ray fluorescence experiment on GaAs(100) polishing wafer under the same condition,and comparing with experimental results with conventional X-ray source and synchrotron light source.
通过对GaAs(100)抛光晶片在相同条件下掠出射X射线荧光实验的可重复性研究,并结合常规光源与同步辐射光源X射线掠出射荧光实验结果的对比,证明自行研制的掠出射X射线荧光平台可重复性较好,稳定性较高,实验方法的设计是合理的。
3)  X-Ray Grazing Incident Diffraction
X射线掠入射
4)  grazing incidence X_ray diffraction
掠角入射X射线衍射
1.
The structural properties of these thin films (In/Zn=0, 1, 2, 3 and 5at%) were studied by grazing incidence X_ray diffraction, conventional X_ray diffraction, Fourier transform infrared spectroscopy, atomic force microscopy and photoluminescence.
使用掠角入射X射线衍射(GI_XRD)、常规X射线衍射、傅里叶变换红外光谱、原子力显微镜、光致发光谱以及不同入射角GI_XRD谱(α=1,2,3和5°)等手段,对不同掺杂浓度的ZnO∶In薄膜进行了结构分析。
5)  grazing incident X-ray diffraction technique
掠入射X射线衍射法
1.
The sin2ψ method is combined with the grazing incident X-ray diffraction technique to obtain the depth profiles of the residual stress in the ground samples.
传统的X射线衍射法称之为sin2ψ法,通常只能测量工件表层的残余应力;本文介绍了一种残余应力测量新方法,该方法联合使用sin2ψ法和掠入射X射线衍射法从而得到残余应力在试件中的深度分布。
6)  Grazing incidence small angle X-ray scattering(GISAXS)
掠入射小角X射线散射
补充资料:掠角入射式装置
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性质:一种凹面光栅装置。狭缝、凹面光栅和出射狭缝(或暗盒)均置于罗兰圆(Rolland circle)上,入射角大于80°时,入射光线便掠入光栅,可以达到全反射。其特点是色散率大、体积小、结构紧凑,但像散严重。利用这种装置可得到从真空紫外区到近紫外区的光谱。

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