1) low energy electron microscopy
低能电子显微术
2) low energy electron microscopy
低能电子显微镜
3) low-voltage scanning lelctron nucroscopyl
低电压扫描电子显微术
4) LEEPS
低能电子点源显微镜
1.
A facility has been developed that can function as a low-energy electron point source(LEEPS) microscope or a field-emission microscope(FEM).
研制了一台集低能电子点源显微镜和场发射显微镜于一体的设备。
5) electron microscopy
电子显微术
1.
The structure of the nanowires was studied using X-ray diffraction, electron microscopy and energy-dispersive X-ray spectroscopy.
利用X射线粉末衍射、电子显微术和X射线能量色散谱等结构分析手段研究了纳米线的微观结构。
2.
07)O_2 film has been investigated by analytical electron microscopy.
目的:本工作利用分析电子显微术和X 射线衍射方法研究了Ti0 93Co0 07O2薄膜材料的显微结构。
3.
Low energy electron microscopy (LEEM) is a newly developed type of microscopy which uses surface true imaging with elastically backscattered low energy elec- trons.
低能电子显微术是新发展起来的一种显微探测技术。
6) transmission electron microscopy
透射电子显微术
1.
The microstructure in the implanted region was studied by transmission electron microscopy.
本文利用透射电子显微术,研究了注入Fe离子的-αAl2O3单晶(sapphire)在还原气氛退火过程中微观结构的变化。
2.
In this papers,we review how energy-filtered transmission electron microscopy is applied to the investigation of quantum dot composition.
本文综述了能量过滤透射电子显微术如何应用于量子点成分的研究。
3.
In this paper we will review transmission electron microscopy(TEM) studies on graphene′s structure,including the layer numbers,stacking,orientation and surface morphology.
文章评述了利用透射电子衍射方法对Graphene的层数、堆垛方式、取向和表面形貌等结构特征进行的研究工作,介绍了利用高分辨透射电子显微术在Graphene的表面缺陷、边缘结构及吸附原子等研究领域取得的最新结果。
补充资料：高分辨电子显微镜(见高分辨电子显微术)
高分辨电子显微镜(见高分辨电子显微术)
high resolution electron microscope
高分辨电子显微镜high resolution eleetronmieroseope见高分辫电子显微术。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条