1) the denotation of elliptically polarized light
椭偏光的表示
2) Identification of elliptical polarization
椭圆偏振的表征
3) Ellipse representation
椭圆表示
4) ellipsometric spectra
椭偏光谱
1.
The optical constant spectra obtained by analyzing the ellipsometric spectra w.
随着电子辐照剂量增加,F型色心缺陷的浓度增大;椭偏光谱分析得到的光学常数谱随电子辐照剂量的变化而改变。
2.
In order to determine optical constants of azo nickel chelate (Ni(azo)_2) thin film, the ellipsometric spectra of Ni(azo)_2 thin film, which prepared by spin-coating method on a single-crystal silicon, have been investigated on a scanning ellipsometer with the analyzer and polarizer rotating synchronously.
在波长扫描和入射角可变全自动椭圆偏振光谱仪上研究了 Ni(azo) 2 薄膜的椭偏光谱。
3.
The ellipsometric spectra of the MgO films have been obtained in the spectral range of 300 ~ 800 nn, and their optical constants and thickness are determined from the ellipsometric spectra.
对生长、制备出的一系列MgO薄膜进行了椭偏光谱测量研究,在300~800nm光谱波长范围内,得到了不同条件下生长制备的MgO薄膜的光学常数谱和膜厚,其结果显示:真空度、衬底温度和激光脉冲能量对生长MgO薄膜的折射率、膜厚均有影响,高真空、高衬底温度和适中的激光脉冲能量有利于生长制备高折射率、高密度和高质量的MgO薄膜。
5) spectroscopic ellipsometry
椭偏光谱
1.
An Overview and Prospect on Modern Spectroscopic Ellipsometry;
现代椭偏光谱学的回顾与展望
2.
The optical properties of the films were measured by spectroscopic ellipsometry in the photon energy range of 0.
用椭偏光谱仪测量了光子能量为 0 。
3.
7 nm were prepared by radio frequency(RF) magnetron sputtering technology at room temperature, and the optical constants of the films were analyzed by reflecting spectroscopic ellipsometry.
7nm的MgF2薄膜样品,并用反射式椭偏光谱技术对薄膜的光学常数进行了测试分析。
6) ellipsometry
[,elip'sɔmitri]
椭偏光谱
1.
0 nm were prepared by DC sputtering deposition and analyzed by X ray diffraction and reflecting ellipsometry.
0nm范围内不同厚度的Ag薄膜 ,并用X射线衍射及反射式椭偏光谱技术对薄膜的微结构和光学常数进行了测试分析。
补充资料：三向碳／碳复合材料的正交偏光彩色金相
三向碳／碳复合材料的正交偏光彩色金相
1429
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条