2) moire interferometry
干涉云纹
1.
Investigated stresses were relieved by cutting specimens along a radial direction, and additional strain fields created by relieving the stresses were measured using moire interferometry.
沿着径向将试件切割,以释放欲测的应力,同时用干涉云纹技术测量由于释放应力而引起的附加应变场。
2.
The residual stress distribution around cold expanded holes was measured by moire interferometry,the influence of reaming and fatigue on the residual stress were investigated experimentally.
应用干涉云纹测量了冷胀孔周残余应力分布，并用实验方法研究了铰孔和疲劳对残余应力的影响。
3) moire interferometry
云纹干涉
1.
The moire interferometry method and moire interferometry-finite element analysis hybrid method have been applied to study interface fracture behaviors of bimaterial specimen which is simulated to porcelain-Fused-to Metal (PFM) restoration.
本文利用云纹干涉法和云纹干涉一有限元混合法,对瓷修复体的模拟双材料模型界面断裂问题进行了实验研究。
2.
The thermal strain of bimetal soldering joint (Cu and Kovar) is analysed with moire interferometry method.
本文采用现代光测力学的云纹干涉法，对铜－可伐焊接件热应变问题进行了实验研究，确定了焊层的热应变特征，结果表明：由于热膨胀系数不匹配、焊层存在复杂的应力状态，它不仅受到焊板材料对它的剪切作用，而且受到纵向拉伸、挤压作用。
3.
Moire interferometry is an optical measurement which is noncontact and has big measuring range, wonderful fringe quality, real-time whole field measurement and high sensitivity, so it can measure the physical quantities about the tiny displacement and strain field of the surface of specimen accurately and effectively.
云纹干涉法是一种具有大量程、极好的条纹质量、非接触测量、实时全场观测和分析的高灵敏度的光学测量方法,能够对物体表面的微小位移和变形场等物理量进行精确有效的测量。
4) moiré interferometry
云纹干涉
1.
This study investigates a new 2-dimensional phase unwrapping method named RIPI (Regional Identification, partition and Integral phase unwrapping method), which is aiming at the problems of "line-draw" and loss of useful data while phase unwrapping in processing moiré interferometry experiment images.
本文针对实验力学云纹干涉图像去包裹处理中容易导致拉线的问题对RIPI(区域识别、划分和积分)去包裹法进行了研究。
2.
The technique of carrier modulation in Moiré interferometry is important in displacement measurement of an object.
在物体变形场的测量中,云纹干涉的载频调制技术有重要作用。
3.
Meanwhile, as a rapidly developing technique of photomechanics, moiré interferometry has attracted attention for its advantages of high sensitivity, excellent contrast, noncontact, real time, whole field, e.
云纹干涉法是一种高灵敏度、高对比度、非接触、实时观测、全场分析的光测力学实验技术；压电陶瓷智能结构以其力电耦合性强、线性控制、高灵敏低迟滞等优点在军工、民用、科研领域都得以广泛应用。
5) moire interferometry
云纹干涉法
1.
Study of creep deformation of metal materials with moire interferometry;
金属材料高温蠕变变形的云纹干涉法实验研究
2.
Thermal deformation measurement of solder joints in surface mounted technique components using Moire interferometry;
表面封装技术组件焊点热变形的云纹干涉法研究
6) Moiré interferometry
云纹干涉法
1.
It is mainly about using the wave front interference principle of Moiré interferometry analyzed the possibility of non-contact measuring elastic modulus and Poisson ratio for high temperature materials by Moiré interferometry and the types of grating specimers of Moiré interferometry in high temperatures.
运用云纹干涉法的波前干涉原理 ,分析激光云纹非接触测量高温材料弹性模量和泊松比的可行性 ,以及高温云纹干涉法试件光栅的类型 ,通过高温云纹干涉测试技术应用和大量的航空高温材料测试 ,解决了材料高温弹性模量和泊松比测试的难题 ,并总结出一套完整的测试方
2.
This paper proposes a method where displacement data measured by moiré interferometry instead of the strain information are used, and finite element method was used to establish the relationship between the displacement and the residual stress.
本文提出用云纹干涉法测量的位移信息代替应变片测量的应变信息来确定残余应力,用有限元建立位移与残余应力之间的关系。
3.
A combined method of moiré interferometry and incremental hole drilling was conducted to study non uniform residual stresses,calculation formula and the experimental technique were presented.
该方法由云纹干涉法测量钻孔释放的位移条纹 ,通过确定孔边待测区域内三个测量点的条纹值 ,可直接得到该区域内的残余应力。
补充资料：杨氏干涉实验
1801年T.杨首先做了光的干涉现象的实验。双缝干涉实验是他做的最著名的实验。为便于理解，现以双孔干涉实验来说明。
实验装置如图1所示。光源S发出光波（源波），用一个屏遮住其波面，只让从屏上两个小孔H1和H2露出的波继续传播而发生干涉。
设S为单色点光源，光振荡的角频率为w；又设相距为b的两孔H1、H2到S的距离相等,则子波源H1和H2的初位相恒保持相同，记以嗞0。于是从H1和H2发出的球面子波可以写成如下复数表达式
式中λ为光波波长，r1和r2分别为接收面∏上某点P到H1和H2的距离。P点的合成场为W(P)=W1(r1)+W2(r2)；其模的二次方即为 P点的光强I(P)。当db时，在0点附近有
该式表明，P点的光强仅取决于P到两孔之间的距离之差│r2-r1│。在满足：
r2-r1＝nλ (n＝0,±1,±2,...)
的那些点处，干涉光强取极大值，为I=4(ɑ/d)2。在满足
的点处光强取极小值,为I＝0。光强为极大值或极小值的所有点的集合分别为亮条纹或暗条纹的中心。在接收面∏上条纹呈双曲线。光强沿x轴的分布(当x远小于d时)为
此函数曲线如图2所示。
杨最初的实验中,屏上开的是两条与x轴方向垂直的狭缝。这时接收面∏上的干涉条纹不是双曲线而是与x轴垂直的直条纹。
实验装置如图1所示。光源S发出光波（源波），用一个屏遮住其波面，只让从屏上两个小孔H1和H2露出的波继续传播而发生干涉。
设S为单色点光源，光振荡的角频率为w；又设相距为b的两孔H1、H2到S的距离相等,则子波源H1和H2的初位相恒保持相同，记以嗞0。于是从H1和H2发出的球面子波可以写成如下复数表达式
式中λ为光波波长，r1和r2分别为接收面∏上某点P到H1和H2的距离。P点的合成场为W(P)=W1(r1)+W2(r2)；其模的二次方即为 P点的光强I(P)。当db时，在0点附近有
该式表明，P点的光强仅取决于P到两孔之间的距离之差│r2-r1│。在满足：
r2-r1＝nλ (n＝0,±1,±2,...)
的那些点处，干涉光强取极大值，为I=4(ɑ/d)2。在满足
的点处光强取极小值,为I＝0。光强为极大值或极小值的所有点的集合分别为亮条纹或暗条纹的中心。在接收面∏上条纹呈双曲线。光强沿x轴的分布(当x远小于d时)为
此函数曲线如图2所示。
杨最初的实验中,屏上开的是两条与x轴方向垂直的狭缝。这时接收面∏上的干涉条纹不是双曲线而是与x轴垂直的直条纹。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条