1) scan electrode
扫描电极
1.
On the basis of the analysis of high voltage driving waveforms and the consideration of the driving circuit design of scan electrode, the design method of the high voltage driving circuit of scan eletrode, and the energy recovery circuit are studied.
介绍了PDP驱动电路的构成,在分析扫描电极高压驱动波形和驱动电路设计考虑的基础上,研究了扫描电极高压驱动电路的实现方法,并对能量恢复电路作了一定的介绍。
2.
In this paper,we introduce the advantages of ALIS driving method,and the design of the driving circuit of scan electrode;Using MAX+plusⅡsoftware,the driving waveform of scan electrode was realized through combining Text editor with Graphic editor.
介绍了表面交替发光(ALIS)驱动方法的原理;介绍了扫描电极驱动电路硬件的设计及实现方法;利用MAX+plusⅡ软件,结合原理图和VHDL语言设计了驱动要求的驱动波形。
2) scanning microelectrode technique
扫描微电极
1.
In this work,the scanning microelectrode technique and potentiodynamic polarization were used to study the localized corrosion behavior of the reinforcing steel in simulated concrete pore solution with different pH values and chloride ion concentrations.
应用扫描微电极法原位测量了模拟混凝土孔隙液中钢筋表面微区的电位分布,并结合动电位极化曲线的测量,研究了钢筋的局部腐蚀行为及模拟混凝土孔隙液pH值和Cl-浓度对它的影响。
3) Scanning microreference electrode technique
扫描微参比电极
1.
Scanning microreference electrode technique (SMRE) was used to probe the potential imaging of 2024 T3 Al alloy in CeCl3 solution.
本文应用自行研制的扫描微参比电极技术(SMRE),原位测量经CeCl3溶液处理的2024-T3Al合金表面微区电位分布,并结合X光电子能谱(XPS)和交流阻抗谱(EIS),对Ce转化膜的成膜机理进行探讨。
4) Scanning micro pH electrode
扫描微pH电极
5) cross scan electrode
十字形扫描电极
1.
In order to enhance the luminance and efficacy further, we proposed a novel cross scan electrode based on the 42 inch SMPDP with diamond cell configuration.
为了进一步提高其亮度和效率,针对42inch荫罩式等离子显示器提出了一种新型十字形扫描电极结构,采用放大单元实验方法,研究了该电极结构的放电过程,给出了高速ICCD拍摄的光分布图。
6) scanning micro reference electrode
扫描微电极技术
1.
In this paper,various techniques with spatial resolution,such as scanning micro reference electrode(SMET),scanning electrochemical microscope(SECM),atomic force microscope(AFM),and scanning Kelvin probe(SKP),and their applications in corrosion studies were briefly reviewed.
简要概述当前国内外具有空间分辨能力的扫描微探针技术及其在腐蚀研究中的应用,包括扫描微电极技术(SMET)、扫描电化学显微镜(SECM)、原子力显微镜(AFM)、扫描Kelvin探针技术(SKP)等,其中SMET、SECM、SKP及局部交流阻抗技术可直接测定腐蚀电极表面或界面电化学不均一性的分布图像,而原子力显微镜技术则是通过分子间作用力从纳米尺寸测量腐蚀过程表面形貌的变化。
补充资料：扫描电子显微镜(见扫描电子显微术)
扫描电子显微镜(见扫描电子显微术)
scanning eleetron mieroseoPe
扫描电子显微镜scanning eleetron mieroseope见扫描电子显微术。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条