1) Memory Build-In Self Diagnosis (MBISD)
存储器内建自诊断
1.
Memory Build-In Self Diagnosis (MBISD) in Memory Build-In Self Test (MBIST) technology is introduced, which is widely used in the design of testability of embedded memories.
针对大规模嵌入式存储器可测性设计技术——存储器内建自测试(MBIST)中的故障诊断问题,介绍了MBIST设计的扩展功能——存储器内建自诊断(MBISD)。
2) memory diagnostic
存储器诊断
3) diagnostic memory
诊断存储器
4) build-in self-diagnosis
内建自诊断
5) memory built-in self-test
存储器内建自测试
1.
MBIST(memory built-in self-test)is very effective in testing embedded memories.
存储器内建自测试 (memorybuilt-inself-test,MBIST)是一种有效的测试嵌入式存储器的方法 。
6) MBIST
存储器内建自测试
1.
MBIST Design for a Radar Signal Processing SOC Chip;
一款雷达信号处理SOC芯片的存储器内建自测试设计
2.
The various possible options were compared,according to the design of embedded SRAM read and write features,select modified March-LR testing algorithm, and the structure of MBIST take parallel test mode, effectively saving chip MBIST to bring hardware overhead.
根据本设计内嵌SRAM的读写特点,选取经过改造的March-LR测试算法,在存储器内建自测试(MBIST)结构上采取并行测试方式,有效地节约了MBIST给芯片带来的硬件开销。
补充资料：随机存取存储器(见半导体存储器)
随机存取存储器(见半导体存储器)
random access memory,RAM
s日1}}Cunq日Ct旧choql随机存取存储器random aeeess memoryRAM)见半导体存储器。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条