1.
A Study on Memory Built-in Self-Test and Functional Core Testing;
存储器内建自测试及内核功能测试研究
2.
Design and Simulation of Memory BIST Based on March C+ Algorithm
基于March C+算法的存储器内建自测试自测试设计与仿真
3.
semiconductor memory test system
半导体存储器测试系统
4.
An All-Digital BIST Scheme for the ADC Test
全数字的模数转换器内建自测试方案
5.
computer-controlled memory test system
计算机控制存储器测试系统
6.
galloping 1 and 0
跃步“１”和“０”-半导体存储器的测试法
7.
galloping write and recovery
跃步写和恢复-半导体存储器的测试法
8.
High Speed Memory Test System Based TIGERSHARC DSP;
基于TIGERSHARC DSP的存储器的高速测试系统
9.
The Storage Test System Designing Based on Programmable Device
基于可编程器件的存储测试系统设计
10.
Research and Realization of the Test Algorithm for Embedded Memory
嵌入式存储器测试算法的研究与实现
11.
RAM Random Access Memory,
随机存取存储器。内存属于这种存储器。
12.
memory buffer register
【自】存储器缓冲寄存器
13.
Application of Ferroelectric RAM in the System for Testing Releaser Lifetime
铁电存储器在脱扣器寿命测试台系统中的应用
14.
Research on Design for Testability and Test Algorithm of Embedded Memory
嵌入式存储器的可测性设计及测试算法研究
15.
Design of the Floating Point Adder and Research of Its Bist
FPU中浮点加法器的设计及其内建自测试的研究
16.
Research of Electric Parameters Measurement System and Storing Performance Demo System for Phase Change Memory;
相变存储器电学性能测试与存储性能演示系统研究
17.
To copy, usually from internal to external storage.
从内存储器到外存储器复制。
18.
Design Optimization of Static Random Acess Memory Bitcell and Testchip;
静态随机存储器位单元与测试结构设计优化