1) transparent based programmable BIST
"透明"的可编程内建自测试
2) BIST
内建自测试
1.
Design of Programmable Memory BIST for Embedded Dual Ports SRAM;
嵌入式双端口SRAM可编程内建自测试结构的设计
2.
Embedded Flash Memory BIST For System-on-a-Chip;
SoC嵌入式flash存储器的内建自测试设计
3.
An All-Digital BIST Scheme for the ADC Test;
全数字的模数转换器内建自测试方案
3) built-in self test
内建自测试
1.
Implementation of quadratic orthogonal demodulation and built-in self test
二次正交解调算法及内建自测试的实现
2.
Aiming at the mixed-signal circuit testing,an integrated built-in self test(BIST) architecture for testing on-chip high speed ADC was presented.
针对混合信号电路的测试问题,提出了一种内建自测试(BIST)结构,分析并给出了如何利用该结构来计算片上高速模数转换器(ADC)的静态参数。
3.
The built-in self test(BIST)method for IP core and the design method for test-oriented IP core are introduced.
介绍了用于IP核测试的内建自测试方法(BIST)和面向测试的IP核设计方法,指出基于IP核的系统芯片(SOC)的测试、验证以及相关性测试具有较大难度,传统的测试和验证方法均难以满足。
4) Build-in self-test
内建自测试
1.
The principle of the SRAM build-in self-test achieving and some advanced algorithms of march are analyzed in details and a typical design method of SRAM BIST is introduced by designing BIST circuits of 16k×32bit SRAM and is implemented on the Altera-EP1S25.
文中介绍了SRAM的典型故障类型和几种常用的测试方法,同时详细分析了嵌入式SRAM存储器内建自测试的实现原理以及几种改进的March算法,另外,以16k×32bitSRAM为例,给出了SRAM内建自测试的一种典型实现,并在Altera-EP1S25上实现。
2.
As a new method of design for testability build-in self-test can prominently improve the testability of the circuits.
内建自测试作为一种新的可测性设计方法,能显著提高电路的可测性。
5) built-in self-test
内建自测试
1.
The Research on Low Power Built-in Self-test Design;
低功耗内建自测试设计方法研究
2.
Study on Built-In Self-Test Methodology for Fault Diagnosis of Mixed-Signal Circuits;
混合信号电路故障诊断的内建自测试（BIST）方法研究
3.
A low power test approach for test or built-in self-test based on arithmetic additive generator is proposed in this paper.
本文提出了一种基于算术加法生成器的测试或内建自测试的低功耗测试方法。
6) built-in self-test(BIST)
内建自测试
1.
To reduce the storage volume of the test data during the built-in self-test(BIST),a new BIST technique based on two dimensional compression of test data is presented.
为压缩内建自测试(BIST)期间所需测试数据存储容量,提出了一种新的基于测试数据两维压缩的BIST方案。
2.
This method can be applied in the mixed-signal circuits test and in the Built-In Self-Test(BIST).
利用伪随机序列作为测试激励,通过计算输入输出的互相关函数得到K维特征空间,在特征空间的基础上进行分析,判别电路有无故障,实验证明该方法简单可行,且提高了测试的效率和正确性,适用于模拟及混合信号测试,适用于混合信号电路的内建自测试(BIST)。
3.
The advantagesand means of built-in self-test(BIST) are exhaustively discussed.
分析了数字VLSI电路的传统测试手段及其存在问题,通过对比的方法,讨论了内建自测试(BIST)技术及其优点,简介了多芯片组件(MCM)内建自测试的目标、设计和测试方案。
补充资料：透明
1.晓悟领会。 2.彻底。 3.能透过光线的。 4.常形容透亮;明白。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条