In order to improve the accuracy of the reliability evaluation for semiconductor parallel system, evaluated are the reliability for this system by using empirical Bayes and classical statistical methods.

The discrete semiconductor testing system is significant for the semiconductor enterprises of packing and testing.

Accelerators simulation experiment on single event effects in semiconductor devices;

In order to improve the forward conduction characteristics of silicon semiconductor devices, a comprehensive study of the influences of boron diffusion, phosphorous diffusion, doping concentration distribution in P~+-P region of sintered Al-Mo electrode and the minority carrier life on the forward conduction characteristics is performed.

They have extensive application prospect in fields such as high brightness light emitting diodes,short wavelength laser diodes,high performance UV detector,and high temperature,high frequency,large power semiconductor devices.

Simulation & Analysis of a Hydrodynamic Model of Semiconductor Devices by a Finite Element Method;

Research for incompetent sources of semiconductor devices which are not up to the standard in DPA;

A Galerkin-MMOCAA scheme for a semiconductor device simulation behavior of a semiconductor device;