1.
The Research and Development of Semiconductor Testing System Based on S3C44B0;
基于S3C44B0的半导体分立器件测试系统的开发
2.
The Development of Discrete Semiconductor Testing System with CPLD Simulated System Bus;
基于CPLD模拟系统总线的半导体分立器件测试系统开发
3.
The Research and Development of Semiconductor Testing Equipment Based on Embedded Technology;
基于嵌入式技术的半导体分立器件测试系统的开发
4.
semiconductor memory test system
半导体存储器测试系统
5.
Study on Testing System of High-power Plane-array Laser s Intensity Distribution Characteristics;
大功率半导体激光器阵列光强分布特性测试系统研究
6.
Study on High-power Laser Diode s Divergence Angle Testing System;
高能半导体激光器发散角测试系统研究
7.
Design of Parameter Testing System for Laser Diode
一种半导体激光器参数测试系统的设计
8.
Request Analysis of Semiconductor Using in Grid-Connected Photovoltaic System
太阳能并网发电系统对半导体器件的需求分析
9.
The Research and Development of Full Automatic Semiconductor Arresrer Testing and Sorting System;
全自动半导体放电管分选测试系统研究与开发
10.
Acceptance and reliability for discrete semiconductor devices
GB/T4938-1985半导体分立器件接收和可靠性
11.
Semiconductor devices-Sectional specification for discrete devices
GB/T12560-1990半导体器件分立器件分规范(可供认证用)
12.
Research of Test System of LD Characteristics Based on Vitrtual Instrument Technology;
基于虚拟仪器技术的半导体激光器特性测试系统的研究
13.
Semiconductor devices--Discrete devices and integrated circuits--Part 5: Optoelectronic devices
GB/T15651-1995半导体器件分立器件和集成电路第5部分:光电子器件
14.
Simple Systems Engineering Analyses and Evaluation for Semiconductor Selected Sub-test Taping Machine
半导体测试分选编带机的简单系统工程分析与评价
15.
Semiconductor devices--Discrete devices--Part 8: Field-effect transistors
GB/T4586-1994半导体器件分立器件第8部分:场效应晶体管
16.
Semiconductor devices Discrete devices and integrated circuits Part 1: General
GB/T17573-1998半导体器件分立器件和集成电路第1部分:总则
17.
Semiconductor devices--Discrete devices and integrated circuits--Part 2: Rectifier diodes
GB/T4023-1997半导体器件分立器件和集成电路第2部分:整流二极管
18.
Semiconductor devices--Discrete devices--Part 3: Signal(including switching)and regulator diodes
GB/T6571-1995半导体器件分立器件第3部分:信号(包括开关)和调整二极管