1) characterization
[英][,kærəktəraɪ'zeɪʃn] [美]['kærəktəraɪ'zeʃən]
刻划
1.
A kind of Equivalent Characterization of Bloch Type Space;
Bloch型空间的一种等价刻划(英文)
2.
New characterizations of metrizerble space in terms of g-fuctions;
度量空间的g-函数新刻划
3) mechanical modification
机械划刻
1.
Two different techniques to fabricate nano scale reference materials are investigated in detail: AFM tip induced local surface oxidation on Si substrate and mechanical modification of Au film with an AFM tip.
提出了两种制备纳米结构样板的方法 :Si基底上的原子力显微镜 (AFM )探针诱导阳极氧化工艺和Au膜上的AFM探针机械划刻工艺 。
4) moving indentation test
刻划实验
5) ruled grating
刻划光栅
1.
Analytical method of the diffraction characteristic of ruled grating based on profile fitting function;
基于槽形函数拟合的刻划光栅衍射特性分析方法
6) mechanical scratching
机械刻划
1.
To study novel methods for fabricating micro/nano and MEMS/NENS structure on the nanometer scale, based on AFM reconstructed system, mechanical scratching mechanism with an AFM tip, effects of positioning accuracy, AFM modes and tip geometry are investigated.
为了探索在纳米尺度加工微纳米结构,MEMS/NEMS器件的新的加工方法,采用基于AFM改造的微加工系统,研究了探针机械刻划机理,分析了工作台的定位精度,AFM的工作模式,探针形状等因素的影响。
补充资料：刻划
1.雕刻;刻印。 2.用文字等描摹表现。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条