The weak absorption and laser induced damage threshold (LIDT) of HfO-2 thin film are measured to testify the negative-ion element impurities breakdown model.

The negative ion element will become the gas source center and form an ejection in the process of evaporation of coating material, so decrease the damage thre.

Determination of Potassium,Calcium and Magnesium Present as Impurities in Lithium Phosphate by Ion-Chromatography;

Determination of Impurities in High Purity Samarium by Inductively Coupled Plasma Mass Spectrometry;

Determination of impurities in nickel by ICP-AES;

Measurement of impurity element in pure gold with ICP-AES method;

Determination of ten impurity elements in zinc concentrate and zinc calcine by inductively coupled plasma atomic emission spectrometry;

Determination of five impurity elements in bismuth and bismuth oxide by inductively coupled plasma-atomic emission spectrometry;

Determination of impurity elements in tungsten concentrates by ICP-MS;

Determination of impurity elements in pure copper by inductively coupled plasma atomic emission spectrometry

The paper describes the technique of accurately measuring concentration of standard solution of Pb, Cd, Mg and determining impurity elements contained in the standard solution of Pb, Cd, Mg, Fe by ICP/MS.

Determination of trace impure elements In Red Lead by ICP-AES after Separsted from tri-phase extraction.;

The Way of Electric ARC AES Determining 12 Impure Elements in Metal Silicon;

Aim To resolve the problems of long period, complex operation and many steps when determining impure elements in ferrosilicon by classic methods.