1) probe card
探针卡
1.
An efficient test system based on the ceramic probe card and the preamplifier presented in this paper achieves a good solution for the impact from the distribution parameters in micromachined gyroscope chip testing.
采用低分布参数陶瓷探针卡和卡上前置放大器的静电驱动测试方案,解决了微机械陀螺管芯测试中分布参数的影响问题,测得准确的频率特性,获得应用、评估中必需的谐振频率、品质因数(Q值)等参数。
2.
A bad management of probe cards will lead to very urgent request of new probe cards or over investment of probe cards under the condition of that there are many products,many probe cards and big fluctuation of delivery requirements in the same factory.
探针卡是芯片测试中最重要、最昂贵的消耗品。
2) Probe
[英][prəʊb] [美][prob]
探针
1.
Research Development of Spectroscopic Probes of Protein;
蛋白质光谱探针的研究进展
2.
Comparison of linewidth measurement using different probe based on the least square fitting model;
基于最小二乘拟合的不同探针测量线宽的比较
3.
DNA probe and its application in food industry;
DNA探针及其在食品工业中的应用
3) tip
[英][tɪp] [美][tɪp]
探针
1.
The Measurement of the Applied Foree of a STM Tip to a Measured Surface;
扫描隧道显微镜探针作用力的测量
2.
The tip's radius of curvature and the relative position to the surface of the sample that influenced the distribution of the surface electric field,thus affected the structure of the oxide.
利用原子力显微镜AFM进行阳极氧化纳米刻蚀加工的实质是电场作用下发生下的电化学反应,探针是影响氧化加工重要的因素。
3.
The imaging mode and the development of tip technologies of atomic force microscopy (AFM) are briefly surveyed.
评述了原子力显微镜（ａｔｏｍｉｃ ｆｏｒｃｅ ｍｉｃｒｏｓｃｏｐｙ，ＡＦＭ）的成镜模式与探针技术的发展以及在脱氧核糖核酸、蛋白质和多糖等生物大分子结构研究中的应用进展，并展望了原子力显微镜在此领域的发展前
4) Probes
[英][prəub] [美][prob]
探针
1.
Study on the Relationships between Chemiluminescent Properties and Molecular Structures of Some Biacridine Probes;
6种不同取代基的双吖啶类探针的化学发光性质及其构效关系的研究
2.
Methods 60-met Oligo probes were designed according to the conserved region of different genotypes of HCV after BLAST.
方法分别对BLAST检索所得的HCV 4个亚型型特异序列逐一进行分析,设计长度均一的60mer Oligo探针,用芯片点样仪将设计好的探针打印到玻片上制备成基因芯片。
3.
To prepare the microarray probes of Bacillus anthracis,pX01 and pX02 of B.
为制备炭疽芽胞杆菌的基因芯片探针文库,以炭疽芽胞杆菌毒素质粒pX01和荚膜质粒pX02为原材料,用Sau3AI酶切pX01和pX02质粒DNA,TaqDNA聚合酶72℃补平加A,经AT克隆,PCR初步鉴定筛选出炭疽质粒片段的阳性克隆。
6) probe card
探卡
1.
wafer-level IC test probe card is mainly used in the test of chip s electric characters before packaging.
集成电路圆片级测试探卡主要应用于芯片分片封装前对芯片电学性能进行初步测量。
2.
As I/O electrodes of IC devices become smaller and high-density, probe cards which contact the I/O pads and test the electrical properties should follow the trend.
随着IC器件上的I/O尺寸减小和密度增加,与之通过接触来进行电性能测试的探卡密度也要相应增加,传统手工制作的环氧树脂针形探卡难以满足使用要求,使用MEMS技术制作探卡成为发展的趋势,但是当前MEMS探卡的主要问题是不能承受和产生破坏焊垫表面氧化层和污染层所需的应力。
3.
Wafer-level IC test probe card is mainly used in the test of chip s electric characters before packaging.
集成电路圆片级测试探卡主要应用于分片封装前对芯片电学性能进行初测。
补充资料：电子探针(见电子探针显微分析)
电子探针(见电子探针显微分析)
electron probe
气二J一，不f丁electron orobom由不，‘.，*二
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条