1) grazing incidence X_ray diffraction
掠角入射X射线衍射
1.
The structural properties of these thin films (In/Zn=0, 1, 2, 3 and 5at%) were studied by grazing incidence X_ray diffraction, conventional X_ray diffraction, Fourier transform infrared spectroscopy, atomic force microscopy and photoluminescence.
使用掠角入射X射线衍射(GI_XRD)、常规X射线衍射、傅里叶变换红外光谱、原子力显微镜、光致发光谱以及不同入射角GI_XRD谱(α=1,2,3和5°)等手段,对不同掺杂浓度的ZnO∶In薄膜进行了结构分析。
2) glancing angle X-ray diffraction
掠射角X射线衍射法
3) grazing incident X-ray diffraction technique
掠入射X射线衍射法
1.
The sin2ψ method is combined with the grazing incident X-ray diffraction technique to obtain the depth profiles of the residual stress in the ground samples.
传统的X射线衍射法称之为sin2ψ法,通常只能测量工件表层的残余应力;本文介绍了一种残余应力测量新方法,该方法联合使用sin2ψ法和掠入射X射线衍射法从而得到残余应力在试件中的深度分布。
4) grazing incidence X-ray diffraction
掠入射X射线衍射
1.
Grazing incidence X-ray diffraction study of La_(0.7)Ca_(0.3)MnO_3 film;
La_(0.7)Ca_(0.3)MnO_3簿膜的掠入射X射线衍射研究
5) X-ray grazing-incidence diffraction
X射线掠入射衍射
6) grazing incidence angle X-ray diffraction(GIAXRD)
掠入射X射线衍射(GIAXRD)
补充资料：捶掠
1.杖击;敲扑。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条