1) X-ray double-crystal diffractometry
X射线双晶摇摆曲线
2) X-ray rocking curve
X射线摇摆曲线
1.
X-ray rocking curves (XRC) show that the full width at half maximum (FWHM) decreases from 0.
随着生长温度的升高,X射线摇摆曲线(XRC)半高宽从0。
2.
FWHM of X-ray rocking curve was adapted to characterize the surface damage.
采用X射线摇摆曲线的半峰宽表征了表面损伤程度。
3) X-ray double crystal rocking diffraction
X射线双晶回摆衍射法
4) XRD rocking curve
X射线衍射分析摇摆曲线
1.
The effect of intermediate deformation (ID) on texturing of Bi-2223 phase was studied during the manufacturing process of Bi-2223/Ag monofilamentary tapes,by means of SEM and XRD rocking curve.
借助于扫描电镜和X射线衍射分析摇摆曲线 ,研究了Bi 2 2 2 3/Ag单芯超导带材制备过程中中间变形对Bi 2 2 2 3超导相织构的影响。
5) crystal rocking curve
晶体的摇摆曲线
6) rocking curve
摇摆曲线
1.
The asymmetrical Bragg reflection STD scan mode with the conventional X-ray diffraction rocking curve was used to determine the lattice distortion of CdZnTe single crystal in this method.
在高分辨X射线衍射仪上,利用不对称布拉格衍射STD技术与单晶摇摆曲线技术相结合的方法,对碲锌镉单晶材料的晶格畸变进行了分析测定。
2.
The reflection peak separations resulting from the misorientation between matrix domain and ferroelastic domain were observed in the rocking curves for several different reflections.
对几个不同的反射 ,可在其摇摆曲线上观测到由基体畴和铁弹畴之间的取向差导致的反射峰的分离。
3.
To meet the requirement of comprehensive characterization of morphology of substrates for EUV multilayer,a suitable combination of different measuring techniques,such as atomic force microscopy (AFM),X-ray diffractometer(XRD) rocking curve and synchrotron radiation(SR) reflec.
研究用不同清洗方法对硅基底表面粗糙度的影响,首先使用原子力显微镜(AFM)直接测量硅片表面粗糙度;然后,利用直流磁控溅射方法,在相同制备工艺条件下镀制M o/S i多层膜,使用X射线衍射仪(XRD)对多层膜二级衍射峰进行摇摆曲线扫描;最后,利用同步辐射测量多层膜的反射率,间接表征基底的粗糙度。
补充资料：摇摇摆摆
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