1.
Design of FFT IP Core and Research of Design for Test
FFT IP核设计及其可测性设计的研究
2.
Testable Design and Testing for the OR-Coincidence Logic System;
或—符合逻辑系统的可测性设计与测试
3.
The DFT and Test Generation of Garfield;
Garfield芯片的可测性设计及测试生成
4.
The Research on SoC Test and Design for Testability;
系统级芯片的测试与可测性设计研究
5.
Design-for-Testability and Test of Garfield Series SoC’s
Garfield系列SoC芯片可测性设计与测试
6.
Executing Module Design and DFT of 32-bit RISC CPU;
32位RISC CPU运算模块的设计及可测性设计
7.
The Research on Design for Testability of FPGAs;
基于FPGA的可测性设计方法研究
8.
The Design for Testability and the Circuit of DSPC50;
DSPC50的可测性设计及电路实现
9.
Testability Design for SoC Based on IDDQ Scanning
基于IDDQ扫描的SOC可测性设计
10.
Design for Testability of Memory in GPS Baseband Chip
GPS基带芯片中存储器的可测性设计
11.
Design for Testability and Implement Technology in ASIC Design
ASIC集成电路的可测性设计与技术实现
12.
Optimal Testability Design of Circuit Boards Based on JTAG
基于JTAG的电路板可测性设计分析技术
13.
The Researches on Mixed-Signal Test and Design for Testability;
数模混合信号芯片的测试与可测性设计研究
14.
Research on Circuit Fault Diagnosis and Low-Power Test;
电路故障诊断可测性设计及低功耗测试研究
15.
VLSI Auto Testing and Design for Test;
集成电路自动测试方法及可测性设计研究
16.
Research on Design for Testability and Test Algorithm of Embedded Memory
嵌入式存储器的可测性设计及测试算法研究
17.
Structural design-for-testability of accumulation-based testing for DSP data path
DSP数据通路基于累加器测试的结构可测性设计
18.
Design Validation and Usability Testing
设计验证和可用性测试