1.
Optical constants of sol-gel derived TiO_2 films characterized by spectroscopic ellipsometry
椭偏光谱法研究溶胶-凝胶TiO_2薄膜的光学常数
2.
Sensitivity analysis of ellipsometric parameters in ellipsometric spectral measurement
椭偏光谱测量中椭偏参数的灵敏度分析
3.
Influence of Substitutes on Optical Properties of Phthalocyanine Thin Films Studied with Ellipsometry
用椭圆偏振光谱法研究取代基对酞菁薄膜光学常数的影响
4.
X-ray Photoelectron Spectroscopy and Spectroscopic Ellipsometry Study of the Thermal Oxide on Gallium Nitride
GaN基热氧化物的XPS和椭偏光谱研究
5.
Ellipsometric Study on Colored Electroplating of Cuprous Oxide on Ni Substrate
镍基彩色电沉积Cu_2O椭圆偏振光谱研究
6.
STUDY ON CORROSION OF MAGNESIUM ALLOY IN SIMULATED COOLING WATER BY MEANS OF IN SITU SPECTROSCOPIC ELLIPSOMETRY
原位椭圆偏振光谱法研究镁合金在模拟冷却水中的腐蚀
7.
Research on the Automatic Ellipsometer Based on Photometric & Unite Method;
基于光度法及混合法的自动椭偏仪研究
8.
Theoretical Study and Analysis of Ellipsometer Method to Determine the Optical Film Parameters
椭偏法测量光学薄膜参数的理论研究与分析
9.
Spectroscopic Ellipsometry and Its Characterization on the Properties of Functional Thin Films;
椭圆偏振光谱技术及其对功能薄膜材料的性能表征
10.
elliptical cladding single-polarization fiber
椭圆包层单偏振光纤
11.
Study on the Optical Properties of B-implanted Lithium Niobate Waveguide with Ellipsometry
椭圆偏振法研究B离子注入LiNbO_3光波导的光学特性
12.
The Determination of Thickness and Refractive Index of Magnetic Garnet Films by Multiple Angle Laser Ellipsometry
激光椭偏仪多角入射法测定磁性石榴石薄膜的厚度和折射率
13.
Study on Ellipsometry in Confirming Polarization Parameters of Phase Slice
确定相薄片偏振参量的椭偏仪法研究
14.
Linearly polarized light will in consequence become elliptically polarized on total reflection.
因此，线偏振光径全反射后将变成椭圆偏振光。
15.
A Compensation Method for Zeeman AAS without Polarizer
无偏光元件塞曼原子吸收光谱补偿方法
16.
When the end of the electric field vector travels in an ellipse, the light is elliptically polarized.
电场矢量的末端沿一椭圆移动的光叫椭圆偏振光。
17.
Non-destructive Quantitative Analysis for Tablets by Use of PLS and Near-infrared Spectroscopy;
近红外光谱-偏最小二乘法无损非破坏药物分析
18.
STUDIES ON TWO COMPONENT BLENDS BY SALS DLI AND IRS METHODS
二元共混高聚物的激光小角散射、光学解偏振和红外光谱法研究