1.
Review of 2009 the 21~(st) IEEE International Symposium of Power Semiconductor Devices and ICs(1)
2009年IEEE功率半导体器件及功率集成电路国际会议述评(上)
2.
Overtemperature protection circuit is very important for power IC.
过热保护电路对于功率集成电路而言无疑是十分重要的。
3.
Applied dedicated thick diaphragm and high-power integrated circuit to have high precision on voltage stability and constant current output.
采用专用的厚膜大功率集成电路,具高精度的稳压及恒流输出特牲。
4.
Study on Pulse Skip Modulation Mode in Smart Power Integrated Circuits and Its Test Technology;
智能功率集成电路的跨周调制PSM及其测试技术研究
5.
Research on Modeling and Simulation of Boundary Heat Transfer Process of High-Power IC Chip;
大功率集成电路芯片界面传热过程建模与仿真研究
6.
integrated power amplifier
集成电路功率放大器
7.
The Design of CMOS Rfic Power Amplifier;
CMOS射频集成电路功率放大器设计
8.
The Three Phases High-voltage Power MOS Gate Drive Integrated Circuit;
三相高压功率MOS栅驱动集成电路
9.
Analysis of the Action of Static Power Dissipation in Burn-in Condition on Yield of VLSI
集成电路老化温度与耗散功率、频率关系的研究
10.
Study on the Simulation and Optimization Methods of Functional Yield of Integrated Circuits
集成电路功能成品率仿真与优化技术研究
11.
high yield ic production
高成品率集成电路生产
12.
Research of High Voltage Integrated Circuit Based on High Voltage MOS Power Device;
基于高压MOS功率器件的高压集成电路的研究
13.
Analysis of the Thermal Process ofthe Large Power Transistor and Integrated Circuit;
大功率晶体管和集成电路的热过程分析
14.
High power microwave vulnerability estimation model of integrated circuit
集成电路高功率微波易损性预测评估模型
15.
integrated circuit functional tester
集成电路功能测试仪
16.
Study of IC Local Defect and Its Related IC Functional Yield and IC Interconnects Electromigration;
集成电路局部缺陷及其相关的功能成品率和电迁徙问题的研究
17.
Development and Implementation of IC Automatic Test Equipment Power VI Source
集成电路自动测试设备大功率电压电流源的设计与实现
18.
Study on the Model of IC s Functional Yield and the Method of Extracting Parameters;
集成电路功能成品率模型及参数提取方法的研究