1.
Beam Hardening Correction Method for Cone-Beam Computed Tomography Based on Registered Model Simulation
基于配准模型仿真的锥束CT射束硬化校正方法
2.
Beam Hardening Correction Method for X-Ray Computed Tomography Based on Subsection Beam Hardening Curves
基于分段硬化曲线的X射线CT射束硬化校正方法
3.
Improvement of Bi-polynomial Method for Beam Hardening Correction Based on Consistency of CT Data
基于CT数据一致性的双多项式射束硬化校正改进
4.
Beam Attenuation Grid-based Scatter Correction Method for Cone Beam CT
基于射束衰减网格的锥束CT散射校正方法
5.
A Dissertation for Master s Degree of Science of Chongqing University;
透射式X射线工业CT中的能谱硬化和散射修正
6.
Correction of Hardening of Energy Spectrum and Scattering for Continuous Spectrum X-ray ICT;
连续谱X射线在ICT中的能谱硬化与散射修正
7.
Scatter Correction Method for Flat-Panel Detector-Based Cone Beam CT
基于平板探测器的锥束CT散射校正方法
8.
peen hardening
弹射硬化, 锺击硬化
9.
Beam Hardening Correction Algorithm Based on Material Attenuation in Computed Tomography
基于材料衰减特性的CT硬化校正算法
10.
3-D rapid ray-tracing and Gaussian ray-beam forward simulation
三维射线快速追踪及高斯射线束正演
11.
EBRIC (Electron Beam Recorder Image Correction)
电子束记录仪图象校正
12.
Finally,the phenomenon of diameter decrement of the alignment valve , the work-harden and the heatingi-up are expeained.
最后对校正气门发生减径、加工硬化和温升等现象作了初步的探讨。
13.
An Improved Method of CT Image Hardening Correction Based on Original Projection
一种改进的基于原始投影数据的CT硬化校正方法
14.
Studies on the Optimum Beam Orbit Correction for High Energy Electron Linacs;
高能电子直线加速器束流轨道校正优化设计研究
15.
A Modified Reduced Hessian SQP Method for Equality Constrained Optimization Based on Quasi-Newton Update Technique;
求解等式约束优化问题的基于拟牛顿校正的既约Hessian SQP方法
16.
A Line Search Filter Two Piece Update of Reduced Hessian Method for Nonlinear Constrained Optimization;
非线性约束优化问题的过滤线搜索两块校正序贯既约Hessian方法
17.
Experimental Research for Real-Time Beam Cleanup in Turbulence Based on Stochastic Parallel-Gradient-Descent Method
随机并行梯度下降湍流场光束净化的实时校正实验研究
18.
Furthermore, the parameters acquired by this method are successfully used for proximity effect correction in electron beam lithography on the same experimental conditions.
此外,用此方法提取的电子散射参数被成功地用于相同实验条件下的电子束临近效应校正.