1.
Subsurface Damage Structure and Eliminating
减少光学元件亚表面缺陷的方法研究
2.
Research on the Visual Detection of Subsurface Defects Using Magneto-Optic Microscopy;
探测亚表面缺陷的磁—光显微成像检测技术研究
3.
Study on the Magneto-Optic/Eddy Current Imaging Technology for Subsurface Micro-defects;
亚表面缺陷的磁光涡流成像检测技术研究
4.
Magnetic Optic Imaging for the Visualization of Subsurface Testing;
磁光成像使亚表面缺陷探测可视化的研究
5.
Total internal reflection microscopy:a subsurface defects identification technique in optically transparent components
光学元件亚表面缺陷的全内反射显微检测
6.
Polarized bidirectional reflectance distribution function by subsurface defects of optical component
光学元件亚表面缺陷偏振双向反射分布函数
7.
Study on the Magneto-optic/Eddy Current Real-time Imaging Detecting Techniques for Sub-surface Defects
亚表面缺陷的磁光/涡流实时成像检测技术的研究
8.
Three-dimensional numerical simulation of light intensity distribution in vicinity of subsurface defect
光学材料亚表面缺陷处强激光电磁场分布的3维模拟
9.
Surface defect terms
GB/T15757-1995表面缺陷术语
10.
unclean surface
不洁的[有缺陷的]表面
11.
Inspect for cosmetic acceptability per cosmetic defect inspection procedure.
依照表面缺陷检验程序做表面检验
12.
Research for Relationship between Steel Defects and Slabs Defects
带钢表面翘皮缺陷与板坯缺陷对应性关系研究
13.
Ingot defects may be broadly classified into internal flaws and surface flaws. Internal flaws are caused by shrinkage.
钢锭缺陷广义上可分为内部缺陷和表面缺陷。内部缺陷是因收缩引起的。
14.
Slip- A defect pattern of small ridges found on the surface of the wafer.
划伤-晶圆片表面上的小皱造成的缺陷。
15.
Mound- A raised defect on the surface of a wafer measuring more than0.25 mm.
堆垛-晶圆片表面超过0.25毫米的缺陷。
16.
Pit- A non-removable imperfection found on the surface of a wafer.
深坑-一种晶圆片表面无法消除的缺陷。
17.
Waviness- Widely spaced imperfections on the surface of a wafer.
波纹-晶圆片表面经常出现的缺陷。
18.
COVERS REPAIR AND REPLACEMENT OF DEFECTIVE PARTS OF THE PRODUCTS.
表面的修复和产品缺陷部位的替换。