1.
A new identification and quautitation method for Radix Salviae Miltiorrhizae
丹参粉末衍射鉴定与丹参酮Ⅱ_A成分定量分析方法研究
2.
Determination of crystallite size and strain by X-ray powder
晶粒尺寸和应变的X射线粉末衍射法测定
3.
neutron powder crystal diffraction patter
粉末晶体中子衍射花样
4.
determination of particle size distributions for fine ceramic raw powders by laser diffraction method
细陶瓷粉末颗粒粒度分布测定方法-激光衍射法
5.
Qualitative analysis of crystalline compounds in an unknown catalyst by XRPD.
粉末X射线衍射法定性分析一种未知催化剂中晶体化合物
6.
Investigation of the Crystallographic Structures of LaNi_(5-x)Al_xD_y by Means of Neutron Powder Diffraction;
LaNi_（5-x）Al_xD_y晶体结构中子粉末衍射研究
7.
Design of Data Acquisition System for High Resolution Powder Diffractometer
高分辨粉末衍射仪数据采集系统研制
8.
Application of powder X-ray diffraction in experiment teaching
粉末X射线衍射技术在实验教学中的应用
9.
Identification of X-ray Diffraction Fourier Pattern of Fuscoporia Obliqua;
桦褐孔菌X射线衍射Fourier图谱的鉴定
10.
Study on Application of X-ray Diffractometer in Identification of Chicken-blood Stone
X射线衍射法在鸡血石鉴定中的应用
11.
Analysis of FT-IR,XRD and SEM about Natural Zeolite;
天然沸石红外光谱X粉末衍射及扫描电镜分析
12.
The effect of the ratio of HPA, oxidant, aniline, the temperature of the reaction system on the conductivity, and solubility of the PANI was investigated, respectively.
采用红外、外可见光谱、射线粉末衍射等手段对产品进行了表征。
13.
Study on Effect of Fill-sample Depth on Determination with Polycrystal Powder X-ray Diffractometer
填样深度对多晶粉末X射线衍射仪测试结果的影响研究
14.
The Aapplication of Minim Farina by Oil Immersed Method at Identify Jewelry and Cultural Relic;
微粉末油浸法在珠宝文物鉴定中的应用
15.
Comparative Study on Microscopic Identification of Powder of Semen Gleditsiae,Fructus Gleditsiae,Fructus Gleditsiae abnormalis
皂角子、皂荚与猪牙皂粉末显微鉴定的比较研究
16.
diffractional pulse-height discriminator
脉冲振幅衍射鉴别器
17.
Identification of national medicine Nest of Macrotermes Annandadei by powder X-ray diffraction Fourier fingerprint pattern
土垅大白蚁菌圃的X射线衍射Fourier指纹图谱鉴定研究
18.
Study on Determination of the Weight Concertration of Free Silicon Dioxide for Dust by Using XRD Technique and the Rietveld Refinement Method;
X射线衍射-Rietveld全谱图拟合法测定粉尘中游离SiO_2含量的研究