1.
The Study of Self-Assemble Ordering Nanosturcture Induced by Graphoepitaxy;
制图外延法自组装有序纳米微结构的研究
2.
Properties of Field Emission from Diamond Film Grown by Expitaxy Method
外延法生长金刚石薄膜场发射特性研究
3.
FABRICATION AND CRYSTALLINITY OF Bi_2Sr_2CaCu_2O_(8+δ)THIN FILMS BY MOLECULAR BEAM EPITAXY
Bi_2Sr_2CaCu_2O_(8+δ)薄膜的分子束外延法制备及结晶性
4.
They're trying to delay until help arrives.
他们设法拖延，等待外援到来。
5.
New Method of Quality Controlling of LED Epi-Wafers
发光二极管外延片质量控制的新方法
6.
Prepare Epitaixial DBCO Film by Flourinate-Free MOD Method and Develop the Epitaxial Process;
无氟-MOD法制备DBCO外延薄膜及工艺研究
7.
Review of Extended Producer Responsibility and the Legislation in Foreign Countries;
生产者延伸责任及国外相关立法综述
8.
A Jurispudential Analysis of Connotation and Denotation of Administraive Object;
行政相对人内涵和外延的法理学分析
9.
The Logic Analysis of the Three Notions:Teacher,Teaching Materials and Teaching Methods
“教师、教材、教法”内涵和外延的逻辑分析
10.
Method for Measuring Thickness of B-Doped p~+-Si Epitaxial Layer
掺硼p~+-Si外延层厚度的测试方法
11.
Bottom-up fabrication of hierarchical ZnO nanostructures by chemical epitaxial growth
化学溶液法外延组装ZnO分级纳米结构
12.
Temperature Estimation of a Heated Armor Plate′s Original Surface Based on Deferred Infrared Temperature-measuring
红外仪延迟测量法确定板坯出炉温度
13.
Lateral epitaxial overgrowth GaN thin film with MOCVD
MOCVD法横向外延过生长GaN薄膜
14.
Measuring thickness of epitaxial layers of gallium arsenide by infrared interference
GB/T8758-1988砷化镓外延层厚度红外干涉测量方法
15.
Test method for crystallographic perfection of epitaxial layers in silicon by etching techniques
GB/T14142-1993硅外延层晶体完整性检查方法腐蚀法
16.
Evaluation of Dislocation Densities in GaN Epilayers by Wet Chemical Etching
湿法化学腐蚀法估算GaN外延层中位错密度
17.
Currently the path delay model consists in parameter estimation.
目前的路径延迟模型是参数估计及外部修正法。
18.
Research on Method of Design & Development of Extensional Product in Product System;
产品系统中外延产品设计开发方法探究