1.
Test method for measuring resistivity of semiconductor silicon or sheet resistance of semiconductor films with a noncontact eddy-current gage
GB/T6616-1995半导体硅片电阻率及硅薄膜薄层电阻测定非接触涡流法
2.
Research on the Technique of Determining the Resistivity of Micro Areas Sheet;
大型硅片内微区薄层电阻均匀性测试技术研究
3.
Research on the Micro-Area Sheet Resistance Test System Based on EIT Technology
基于EIT技术的微区薄层电阻测试系统研究
4.
" Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array"
GB/T14141-1993硅处延层、扩散层和离子注入层薄层电阻的测定直排四探针法
5.
Study on the Four Point Probe Technique for the Sheet Resistance Measurement of the Micro-Area Integrating with Image Analysis;
结合图像分析的微区薄层电阻四探针测试技术研究
6.
Study on Silicon Sheet s Micro-Area s Resistance Stability Measured by Four Point Probe Method;
用四探针法测试硅片微区薄层电阻的稳定性研究
7.
Studies on Magnetoresistance in Fe/In/Fe Trilayers;
Fe/In/Fe三层薄膜磁电阻效应的研究
8.
Influence of Buffer Layer on the Anisotropic Magnetoresistance of NiCo Films;
缓冲层对NiCo薄膜各向异性磁电阻的影响
9.
Fabrication and Application of Electrolyte Film with YSZ as Block Film
带有YSZ阻挡层的电解质薄膜的制备及应用研究
10.
Effects of Al_2O_3 Layer on Performance of Ultrathin Permalloy Films
Al_2O_3层对超薄各向异性磁电阻薄膜性能影响的研究
11.
Research of WN film as diffusion barrier layer in ULSI-Cu metallization
集成电路亚45nm级铜布线扩散阻挡层WN薄膜的研究
12.
single grain layer varistor
单颗粒层电压敏电阻器
13.
Preparation and properties of SiCN diffusion barrier film for Cu interconnect in ULSI
SiCN扩散阻挡层薄膜的制备及特性研究
14.
IR Mechanism of Film Capacitors with Series Construction
内串式薄膜电容器绝缘电阻探测技术
15.
On the reliability of resistance measurement of conducting thin films
导电薄膜电阻测量技术的可靠性研究
16.
Theoretical Analysis of the CMI for Magnetic Material of Multi-layer Complex Film Structure with Insulating Layer;
带绝缘层多层复合薄膜巨磁阻抗效应理论研究
17.
To coat or cover with a thin layer of metal by electrodeposition.
电镀用电淀积法覆盖以一层薄金属层
18.
surface-barrier phototransistor
表面阻挡层光电晶体管