1.
Finally, according to the real conditions of sine-scan vibration test, simulation was accomplished by using the given algorithm.
最后,给出了正弦扫描试验仿真的算法并实现了振动台正弦扫描试验仿真。
2.
general rules for scanning electron microscopy
扫描电子显微镜试验方法通则
3.
Application and Experiment of Airborne Laser Scanner Detecting Data;
机载激光扫描测高数据的应用与试验
4.
Design and Exploitation of a Boundary Scan Test Experiment System
边界扫描测试实验系统的设计与开发
5.
Application experiment of airborne laser scanner detecting system
机载激光扫描测距(LIDAR)系统的应用试验
6.
Examination of Hair Perforation in Vitro and Observation by Scanning Electron Microscope on Microsporum Canis
犬小孢子菌毛发穿孔试验及扫描电镜观察
7.
Delay Fault Test in Boundary Scan and Scan Path Architectures
扫描与边界扫描电路延迟故障的测试
8.
Ex Vivo Comparative Study on Lumbar Spine Disc Height and Curvature between Axially-loaded MSCT and Conventional MSCT Scanning
腰椎轴向负荷CT扫描与常规CT扫描椎体间成角及椎间隙高度的对比性试验研究
9.
vertical interval test signal
帧扫描期插入测试信号
10.
Textile material--Test method for themo transition temperature--Differential scanning calorimetry(DSC)
GB/T17594-1998纺织材料热转变温度试验方法差示扫描量热法
11.
Reagent of fireworks and firecrackers--Thermal compatibility test--Method of DTA and DSC
GB/T15814.3-1995烟花爆竹药剂热相容性试验差热分析或差示扫描热量热法
12.
The Experimental Research of Motional Phantom on Accurate Radiotherapy of Lung Cancer Guided by PET-CT Image;
PET-CT扫描引导下肺癌精确放疗的运动体模试验研究
13.
Research of Applying Boundary-Scan Test Technology in Remote Experiment System;
边界扫描测试技术在远程实验系统中的应用研究
14.
Study on Active Vibration-Reduction System of Simulated Vibration-Isolation Testing Table for Stepping and Scanning Lithography;
步进扫描光刻机模拟隔振试验平台主动减振系统研究
15.
Applying TTM To Estimate The Research In Diagnosis Examination About Subhealth Condition
应用热扫描成像技术评价亚健康状态的诊断试验研究
16.
Scanning electronic microscopy tests for calculating micro-texture coefficient of skid resistant aggregates
沥青路面抗滑集料微观纹理系数计算及试验——基于扫描电镜法
17.
Model Test Study for Quality Checks of Pre-stressed Pipe Grouting by Means of Scanning Type Shock Echo Method
扫描式冲击回波法检测预应力管道灌浆质量的模型试验研究
18.
Research on Low-Power Test in VLSI Scan Test;
VLSI扫描测试中的低功耗测试方法研究