1.
logic integrated circuit tester
逻辑集成电路测试仪
2.
Improvement of Back Logic Circuit of IC Test System and Research of Analog Delay Line Capability;
集成电路测试系统后逻辑支持电路改进与模拟延迟线性能分析
3.
linear IC tester
线性集成电路测试仪
4.
integrated circuit functional tester
集成电路功能测试仪
5.
digital integrated circuit measuring-testing instrument
数字集成电路测试仪
6.
IC logic control
集成电路逻辑电磁控制
7.
integrated circuit DC parameter tester
集成电路直流参数测试仪
8.
linear integrated circuit automatic tester
线性集成电路自动测试仪
9.
digital integrated circuit replay function testing instrument
数字集成电路再现功能测试仪
10.
IIIL (isoplanar integrated injection logic)
等平面集成注入逻辑电路
11.
field programmable logic integrated circuit
现场可编程序逻辑集成电路
12.
field programmable logic family
现场可编程序逻辑集成电路系列
13.
Implementation of Boolean Expression Diagrams and Its Application to the Testability of the Fault of Integrated Circuits
逻辑表达式图的实现及其在集成电路故障可测性中的应用
14.
The Research of Calibrating the Error of Linear IC Tester
线性集成电路测试仪误差校验方法的研究
15.
Application of Virtual Instruments Technique in HIC Testing;
虚拟仪器技术在厚膜混合集成电路测试中应用
16.
Designed of Numerical Integrated Circuit Parameter Test Instrument Base on MCU
基于单片机数字集成电路参数测试仪的设计
17.
Research and Application of IC Test Instrument Power Circuit Simulation Design
集成电路测试仪电源电路的仿真设计研究与应用
18.
SSI chips are usually basic logic gates and flip-flops.
小型集成电路通常是最基本的逻辑栅门。